{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T21:21:24Z","timestamp":1725571284578},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,12]]},"DOI":"10.1109\/icm.2017.8268853","type":"proceedings-article","created":{"date-parts":[[2018,1,30]],"date-time":"2018-01-30T16:05:26Z","timestamp":1517328326000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["An automated CAD tool for rapid technology characterization"],"prefix":"10.1109","author":[{"given":"Omar","family":"Elgabry","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Faisal","family":"Hussien","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ahmed N.","family":"Mohieldin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9781139021128.005"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2008.4483944"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/2463209.2488774"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228414"},{"key":"ref8","article-title":"Automatic design for analog\/RF front-end system in 802. 11 ac receiver","author":"pan","year":"0","journal-title":"Design Automation Conference"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2014.6868804"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2011.5783095"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2012.6219027"}],"event":{"name":"2017 29th International Conference on Microelectronics (ICM)","start":{"date-parts":[[2017,12,10]]},"location":"Beirut","end":{"date-parts":[[2017,12,13]]}},"container-title":["2017 29th International Conference on Microelectronics (ICM)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8255703\/8268805\/08268853.pdf?arnumber=8268853","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,3,5]],"date-time":"2018-03-05T17:15:16Z","timestamp":1520270116000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8268853\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,12]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/icm.2017.8268853","relation":{},"subject":[],"published":{"date-parts":[[2017,12]]}}}