{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,17]],"date-time":"2025-12-17T08:25:58Z","timestamp":1765959958520},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,12]]},"DOI":"10.1109\/icm.2017.8268862","type":"proceedings-article","created":{"date-parts":[[2018,1,30]],"date-time":"2018-01-30T16:05:26Z","timestamp":1517328326000},"page":"1-5","source":"Crossref","is-referenced-by-count":2,"title":["Developing a test platform for PV panels"],"prefix":"10.1109","author":[{"given":"Tilda","family":"Akiki","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Laura","family":"Eid","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Serena","family":"Abboud","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bechara","family":"Nehme","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"L’ Accompagnement de la stratégic énergétique à travers la recherche et développement","year":"2016","key":"ref4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/EFEA.2014.7059994"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.4028\/www.scientific.net\/AMR.433-440.6409"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2009.03.013"},{"key":"ref7","article-title":"Laser Focus World","author":"wallace","year":"2014","journal-title":"Laser Focus World"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.egypro.2014.12.418"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MELCON.2008.4618498"}],"event":{"name":"2017 29th International Conference on Microelectronics (ICM)","start":{"date-parts":[[2017,12,10]]},"location":"Beirut","end":{"date-parts":[[2017,12,13]]}},"container-title":["2017 29th International Conference on Microelectronics (ICM)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8255703\/8268805\/08268862.pdf?arnumber=8268862","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,2,28]],"date-time":"2018-02-28T16:41:31Z","timestamp":1519836091000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8268862\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,12]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/icm.2017.8268862","relation":{},"subject":[],"published":{"date-parts":[[2017,12]]}}}