{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,9]],"date-time":"2026-01-09T15:39:17Z","timestamp":1767973157689,"version":"3.49.0"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,12,1]],"date-time":"2019-12-01T00:00:00Z","timestamp":1575158400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,12,1]],"date-time":"2019-12-01T00:00:00Z","timestamp":1575158400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,12,1]],"date-time":"2019-12-01T00:00:00Z","timestamp":1575158400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,12]]},"DOI":"10.1109\/icm48031.2019.9021938","type":"proceedings-article","created":{"date-parts":[[2020,3,6]],"date-time":"2020-03-06T08:03:39Z","timestamp":1583481819000},"page":"18-22","source":"Crossref","is-referenced-by-count":6,"title":["Improved Automatic Correction for Digital VLSI Circuits"],"prefix":"10.1109","author":[{"given":"Lamya","family":"Gaber","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Aziza I.","family":"Hussein","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mohammed","family":"Moness","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2812123"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-018-5747-4"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICM.2016.7847940"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/43.811329"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2007.358111"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2030593"},{"key":"ref16","first-page":"1","article-title":"Abstraction and refinement techniques in automated design debugging","author":"safarpour","year":"0","journal-title":"2007 Design Automation & Test in Europe Conference & Exhibition"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090870"},{"key":"ref18","article-title":"The ISCAS'85 benchmark circuits and netlist format","volume":"25","author":"bryan","year":"1985","journal-title":"North Carolina State University"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1989.100747"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCES.2017.8275337"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2061270"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/2966986.2967036"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.852031"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2014.6847833"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2012.6165043"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/1366110.1366131"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-70545-1_3"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2015.41"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1080\/0952813X.2014.954274"}],"event":{"name":"2019 31st International Conference on Microelectronics (ICM)","location":"Cairo, Egypt","start":{"date-parts":[[2019,12,15]]},"end":{"date-parts":[[2019,12,18]]}},"container-title":["2019 31st International Conference on Microelectronics (ICM)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9000745\/9021274\/09021938.pdf?arnumber=9021938","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,17]],"date-time":"2022-07-17T17:50:00Z","timestamp":1658080200000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9021938\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,12]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/icm48031.2019.9021938","relation":{},"subject":[],"published":{"date-parts":[[2019,12]]}}}