{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,10]],"date-time":"2025-05-10T06:49:06Z","timestamp":1746859746101,"version":"3.28.0"},"reference-count":5,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,12,17]],"date-time":"2023-12-17T00:00:00Z","timestamp":1702771200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,12,17]],"date-time":"2023-12-17T00:00:00Z","timestamp":1702771200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,12,17]]},"DOI":"10.1109\/icm60448.2023.10378884","type":"proceedings-article","created":{"date-parts":[[2024,1,5]],"date-time":"2024-01-05T14:29:06Z","timestamp":1704464946000},"page":"222-227","source":"Crossref","is-referenced-by-count":2,"title":["Emotion Recognition Based on Electroencephalogram (EEG) Signals"],"prefix":"10.1109","author":[{"given":"Khader","family":"Mohammad","sequence":"first","affiliation":[{"name":"Birzeit University,Department of Computer Engineering"}]},{"given":"Saleem","family":"Hamo","sequence":"additional","affiliation":[{"name":"Birzeit University,Department of Computer Engineering"}]},{"given":"Mohammad","family":"Abbas","sequence":"additional","affiliation":[{"name":"Birzeit University,Department of Computer Engineering"}]},{"given":"Maen","family":"Mohammad","sequence":"additional","affiliation":[{"name":"Al-Quds University,Department of Computer Engineering"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.proeng.2012.06.298"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1136\/jnnp.74.1.9"},{"key":"ref3","article-title":"FUNDAMENTALS OF EEG MEASUREMENT","volume":"2","author":"Teplan","year":"2002","journal-title":"In: Jour-nal of the Institute of Measurement Science"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICEMIS.2017.8272991"},{"article-title":"A NOVEL EEG FEA-TURE EXTRACTION METHOD USING HAJORTH PARAMETER","year":"2014","author":"Seung-Hyeon","key":"ref6"}],"event":{"name":"2023 International Conference on Microelectronics (ICM)","start":{"date-parts":[[2023,12,17]]},"location":"Abu Dhabi, United Arab Emirates","end":{"date-parts":[[2023,12,20]]}},"container-title":["2023 International Conference on Microelectronics (ICM)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10378847\/10378878\/10378884.pdf?arnumber=10378884","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,24]],"date-time":"2024-01-24T00:57:22Z","timestamp":1706057842000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10378884\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,12,17]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/icm60448.2023.10378884","relation":{},"subject":[],"published":{"date-parts":[[2023,12,17]]}}}