{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T03:22:41Z","timestamp":1725506561035},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,4]]},"DOI":"10.1109\/icmcs.2014.6911246","type":"proceedings-article","created":{"date-parts":[[2014,10,8]],"date-time":"2014-10-08T20:49:12Z","timestamp":1412801352000},"page":"1573-1578","source":"Crossref","is-referenced-by-count":0,"title":["A workbench development for L-band LDMOS amplifier reliability study (electronic power transistors reliabilty for radar applications)"],"prefix":"10.1109","author":[{"given":"Pascal","family":"Dherbecourt","sequence":"first","affiliation":[]},{"given":"Olivier","family":"Latry","sequence":"additional","affiliation":[]},{"given":"Eric","family":"Joubert","sequence":"additional","affiliation":[]},{"given":"Karine","family":"Dehais-Mourgues","sequence":"additional","affiliation":[]},{"given":"Hichame","family":"Maanane","sequence":"additional","affiliation":[]},{"given":"Jean Pierre","family":"Sipma","sequence":"additional","affiliation":[]},{"given":"Philippe","family":"Eudeline","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"year":"2007","key":"ref4","article-title":"An introduction to the basics of reliability and rish analysis"},{"journal-title":"Semiconductor Device Reliability Failure] Semiconductor Device Reliability Failure Models","article-title":"International Sematech technology transfert","year":"2000","key":"ref3"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2005.12.004"},{"journal-title":"Handbook of Reliability Availability Maintainability and Safety in Engineering Design","article-title":"Rudolph Frederick Stapelberg","year":"2009","key":"ref6"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2011.03.040"},{"article-title":"Reliability, maintainability, and risk, practical methods for engineers","year":"2001","author":"smith","key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2010.07.086"},{"journal-title":"Life Cycle Reliability Engineering","article-title":"Guangbin Yang","year":"2007","key":"ref7"},{"year":"2004","key":"ref2","article-title":"Reliability Qualification of Semiconductor Devices Based on Physics of Failure, Risk and Opportunity Assessment"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2005.07.099"},{"year":"1990","key":"ref1"}],"event":{"name":"2014 International Conference on Multimedia Computing and Systems (ICMCS)","start":{"date-parts":[[2014,4,14]]},"location":"Marrakech, Morocco","end":{"date-parts":[[2014,4,16]]}},"container-title":["2014 International Conference on Multimedia Computing and Systems (ICMCS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6900112\/6911126\/06911246.pdf?arnumber=6911246","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T22:27:37Z","timestamp":1490308057000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6911246\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,4]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/icmcs.2014.6911246","relation":{},"subject":[],"published":{"date-parts":[[2014,4]]}}}