{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,22]],"date-time":"2026-01-22T14:49:39Z","timestamp":1769093379020,"version":"3.49.0"},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009,6]]},"DOI":"10.1109\/icme.2009.5202588","type":"proceedings-article","created":{"date-parts":[[2009,8,24]],"date-time":"2009-08-24T11:04:46Z","timestamp":1251111886000},"page":"682-685","source":"Crossref","is-referenced-by-count":32,"title":["Using one-class SVM outliers detection for verification of collaboratively tagged image training sets"],"prefix":"10.1109","author":[{"given":"Hanna","family":"Lukashevich","sequence":"first","affiliation":[{"name":"Fraunhofer Institute for Digital Media Technology Ehrenbergstr. 31, 98693 Ilmenau, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Stefanie","family":"Nowak","sequence":"additional","affiliation":[{"name":"Fraunhofer Institute for Digital Media Technology Ehrenbergstr. 31, 98693 Ilmenau, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Peter","family":"Dunker","sequence":"additional","affiliation":[{"name":"Fraunhofer Institute for Digital Media Technology Ehrenbergstr. 31, 98693 Ilmenau, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1145\/1386352.1386358"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1145\/1460096.1460114"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/76.927422"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1145\/1460096.1460104"},{"key":"7","first-page":"427","article-title":"modeling and recognition of landmark image collections using iconic scene graphs","author":"li","year":"2008","journal-title":"Proc of the 10th European Conf on Computer Vision"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2007.4409099"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2006.57"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2005.142"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1162\/089976601750264965"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2008.4587621"},{"key":"11","doi-asserted-by":"crossref","first-page":"1285","DOI":"10.1126\/science.3287615","article-title":"measuring the accuracy of diagnostic systems","volume":"240","author":"swets","year":"1988","journal-title":"Science"}],"event":{"name":"2009 IEEE International Conference on Multimedia and Expo (ICME)","location":"New York, NY, USA","start":{"date-parts":[[2009,6,28]]},"end":{"date-parts":[[2009,7,3]]}},"container-title":["2009 IEEE International Conference on Multimedia and Expo"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5174546\/5202415\/05202588.pdf?arnumber=5202588","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,6,8]],"date-time":"2021-06-08T07:22:45Z","timestamp":1623136965000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/5202588\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,6]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/icme.2009.5202588","relation":{},"subject":[],"published":{"date-parts":[[2009,6]]}}}