{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,14]],"date-time":"2026-09-14T01:21:20Z","timestamp":1789348880221,"version":"build-2803163510"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,7,5]],"date-time":"2021-07-05T00:00:00Z","timestamp":1625443200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,7,5]],"date-time":"2021-07-05T00:00:00Z","timestamp":1625443200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,7,5]]},"DOI":"10.1109\/icme51207.2021.9428259","type":"proceedings-article","created":{"date-parts":[[2021,6,9]],"date-time":"2021-06-09T21:14:21Z","timestamp":1623273261000},"page":"1-6","source":"Crossref","is-referenced-by-count":8,"title":["Rethinking Noise Modeling in Extreme Low-Light Environments"],"prefix":"10.1109","author":[{"given":"Jing","family":"Wang","sequence":"first","affiliation":[{"name":"Sony China Ltd,R&D Center Beijing Lab,Beijing,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yitong","family":"Yu","sequence":"additional","affiliation":[{"name":"Smartmore Technology,Shenzhen,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Songtao","family":"Wu","sequence":"additional","affiliation":[{"name":"Sony China Ltd,R&D Center Beijing Lab,Beijing,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Chang","family":"Lei","sequence":"additional","affiliation":[{"name":"Columbia University,Department of Computer Science,New York,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Kuanhong","family":"Xu","sequence":"additional","affiliation":[{"name":"Sony China Ltd,R&D Center Beijing Lab,Beijing,China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/34.276126"},{"key":"ref11","article-title":"Black level correction for imaging pixels","author":"zhang","year":"2014","journal-title":"US Patent"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1117\/12.769079"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ITSC.2003.1251925"},{"key":"ref14","article-title":"Noise2noise: Learning image restoration without clean data","author":"lehtinen","year":"2018"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2003.819861"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2019.00421"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICME.2019.00162"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.01129"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.00283"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2008.2001399"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.294"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00347"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2007.896718"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.cviu.2018.10.010"}],"event":{"name":"2021 IEEE International Conference on Multimedia and Expo (ICME)","location":"Shenzhen, China","start":{"date-parts":[[2021,7,5]]},"end":{"date-parts":[[2021,7,9]]}},"container-title":["2021 IEEE International Conference on Multimedia and Expo (ICME)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9428049\/9428068\/09428259.pdf?arnumber=9428259","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,5,1]],"date-time":"2023-05-01T18:27:50Z","timestamp":1682965670000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9428259\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,7,5]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/icme51207.2021.9428259","relation":{},"subject":[],"published":{"date-parts":[[2021,7,5]]}}}