{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,9]],"date-time":"2025-09-09T21:45:28Z","timestamp":1757454328714},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,12]]},"DOI":"10.1109\/icmla.2018.00131","type":"proceedings-article","created":{"date-parts":[[2019,1,18]],"date-time":"2019-01-18T01:34:26Z","timestamp":1547775266000},"source":"Crossref","is-referenced-by-count":8,"title":["A Comparison of Supervised Approaches for Process Pattern Recognition in Analog Semiconductor Wafer Test Data"],"prefix":"10.1109","author":[{"given":"Stefan","family":"Schrunner","sequence":"first","affiliation":[]},{"given":"Olivia","family":"Bluder","sequence":"additional","affiliation":[]},{"given":"Anja","family":"Zernig","sequence":"additional","affiliation":[]},{"given":"Andre","family":"Kaestner","sequence":"additional","affiliation":[]},{"given":"Roman","family":"Kern","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/AISP.2012.6313800"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1950.tb00463.x"},{"key":"ref12","article-title":"A reduction of the elastic net to support vector machines with an application to gpu computing","author":"zhou","year":"2015","journal-title":"Proceedings of the Twenty-Ninth AAAI Conference on Artificial Intelligence"},{"key":"ref13","author":"aggarwal","year":"2015","journal-title":"Data Classification Algorithms and Applications"},{"key":"ref14","article-title":"Using wavelet transform and neural network approach to develop a wafer bin map pattern recognition model","author":"liu","year":"2008","journal-title":"International MultiConference of Engineers and Computer Scientists"},{"key":"ref15","article-title":"Wafer map failure pattern recognition and similarity ranking for large-scale data sets","author":"wu","year":"2015","journal-title":"IEEE Transactions on Semiconductor Manufacturing"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2017.2729469"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2017.2768323"},{"key":"ref4","author":"santos","year":"0","journal-title":"Pattern recognition in analog wafermaps a comparison of classical image processing and a deep generative model"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.patrec.2015.11.019"},{"key":"ref6","doi-asserted-by":"crossref","DOI":"10.1007\/978-0-387-84858-7","author":"hastie","year":"2009","journal-title":"The Elements of Statistical Learning"},{"key":"ref5","author":"bishop","year":"2006","journal-title":"Pattern Recognition and Machine Learning"},{"key":"ref8","article-title":"Round robin classification","author":"f\u00fcmkranz","year":"2002","journal-title":"Journal of Machine Learning Research"},{"key":"ref7","article-title":"Reducing multiclass to binary: a unifing approach for margin classifiers","author":"allwein","year":"2000","journal-title":"Journal of Machine Learning Research"},{"key":"ref2","article-title":"Texture unit, texture xpectrum, and texture analysis","author":"he","year":"1990","journal-title":"IEEE Transactions on Geoscience and Remote Sensing"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IPTA.2017.8310124"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"658","DOI":"10.1007\/978-3-540-74958-5_65","article-title":"Efficient pairwise classification","author":"park","year":"2007","journal-title":"Machine Learning ECML 2007"}],"event":{"name":"2018 17th IEEE International Conference on Machine Learning and Applications (ICMLA)","location":"Orlando, FL","start":{"date-parts":[[2018,12,17]]},"end":{"date-parts":[[2018,12,20]]}},"container-title":["2018 17th IEEE International Conference on Machine Learning and Applications (ICMLA)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8613701\/8614025\/08614156.pdf?arnumber=8614156","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T22:27:20Z","timestamp":1643236040000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8614156\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,12]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/icmla.2018.00131","relation":{},"subject":[],"published":{"date-parts":[[2018,12]]}}}