{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,11,22]],"date-time":"2024-11-22T05:29:58Z","timestamp":1732253398715,"version":"3.28.0"},"reference-count":0,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,10,18]],"date-time":"2024-10-18T00:00:00Z","timestamp":1729209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,10,18]],"date-time":"2024-10-18T00:00:00Z","timestamp":1729209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,10,18]]},"DOI":"10.1109\/icmlca63499.2024.10754314","type":"proceedings-article","created":{"date-parts":[[2024,11,21]],"date-time":"2024-11-21T19:04:04Z","timestamp":1732215844000},"page":"160-164","source":"Crossref","is-referenced-by-count":0,"title":["Integrated Circuit Image Feature Extraction Based on K-Means Clustering Combined with Harris"],"prefix":"10.1109","author":[{"given":"Qing","family":"Liu","sequence":"first","affiliation":[{"name":"School of Electronic Information & Electrical Engineering, Tianshui Normal University,Tianshui,China,741001"}]},{"given":"Yubo","family":"Zhou","sequence":"additional","affiliation":[{"name":"School of Electronic Information & Electrical Engineering, Tianshui Normal University,Tianshui,China,741001"}]},{"given":"Huiling","family":"Li","sequence":"additional","affiliation":[{"name":"School of Electronic Information & Electrical Engineering, Tianshui Normal University,Tianshui,China,741001"}]},{"given":"Kun","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Electronic Information & Electrical Engineering, Tianshui Normal University,Tianshui,China,741001"}]},{"given":"Limin","family":"Zhao","sequence":"additional","affiliation":[{"name":"School of Electronic Information & Electrical Engineering, Tianshui Normal University,Tianshui,China,741001"}]},{"given":"Xiangbing","family":"Li","sequence":"additional","affiliation":[{"name":"School of Electronic Information & Electrical Engineering, Tianshui Normal University,Tianshui,China,741001"}]},{"given":"Yuxiang","family":"Zhao","sequence":"additional","affiliation":[{"name":"School of Electronic Information & Electrical Engineering, Tianshui Normal University,Tianshui,China,741001"}]},{"given":"Jinfang","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Electronic Information & Electrical Engineering, Tianshui Normal University,Tianshui,China,741001"}]},{"given":"Jinbing","family":"Zhang","sequence":"additional","affiliation":[{"name":"Tianshui Huatian Technology Co., Ltd,Tianshui,China,741001"}]}],"member":"263","event":{"name":"2024 5th International Conference on Machine Learning and Computer Application (ICMLCA)","location":"Hangzhou, China","start":{"date-parts":[[2024,10,18]]},"end":{"date-parts":[[2024,10,20]]}},"container-title":["2024 5th International Conference on Machine Learning and Computer Application (ICMLCA)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10753642\/10753684\/10754314.pdf?arnumber=10754314","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,21]],"date-time":"2024-11-21T19:04:44Z","timestamp":1732215884000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10754314\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,10,18]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/icmlca63499.2024.10754314","relation":{},"subject":[],"published":{"date-parts":[[2024,10,18]]}}}