{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,1]],"date-time":"2025-07-01T08:47:37Z","timestamp":1751359657592,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,6]]},"DOI":"10.1109\/icphm49022.2020.9187046","type":"proceedings-article","created":{"date-parts":[[2020,9,7]],"date-time":"2020-09-07T22:32:50Z","timestamp":1599517970000},"page":"1-6","source":"Crossref","is-referenced-by-count":4,"title":["Integrated Deep Learning and Statistical Process Control for Online Monitoring of Manufacturing Processes"],"prefix":"10.1109","author":[{"given":"Safwan","family":"Ahmad","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nastaran","family":"Enshaei","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Farnoosh","family":"Naderkhani","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Anjali","family":"Awasthi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2019.2897690"},{"key":"ref11","first-page":"1","article-title":"Segmentation-based Deep-learning Approach for Surface-Defect Detection","author":"tabernik","year":"2019","journal-title":"Journal of Intelligence Manufacturing"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1115\/1.4044420"},{"key":"ref13","first-page":"1","article-title":"Application of Deep Learning for Fault Diagnostic in Induction Machine’s Bearings","author":"enshaei","year":"2019","journal-title":"IEEE International Conference on Prognostic and Health Management"},{"article-title":"Rich feature hierarchies for accurate object detection and semantic segmentation","year":"2013","author":"girshick","key":"ref14"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2015.169"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.351"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.91"},{"key":"ref18","article-title":"TensorFlow: Large-scale machine learning on hetero- geneous Systems","author":"abadi","year":"2015","journal-title":"software available from tensorflow org"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2014.2327029"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1093\/clinchem\/43.4.594"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"8","DOI":"10.1080\/00224065.1997.11979720","article-title":"Designing a Multivariate EWMA Control Chart","volume":"29","author":"knuth","year":"1997","journal-title":"Journal of Quality Technology"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1023\/B:STCO.0000035301.49549.88"},{"key":"ref5","first-page":"41","article-title":"A comparison of event models for naive Bayes text classification","author":"mccallum","year":"1998","journal-title":"Proc Workshop on Learning for Text Categorization"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1080\/08839514.2019.1583862"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3390\/app9153127"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1214\/aoms\/1177732979"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1080\/00224065.2011.11917848"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.addma.2018.09.034"}],"event":{"name":"2020 IEEE International Conference on Prognostics and Health Management (ICPHM)","start":{"date-parts":[[2020,6,8]]},"location":"Detroit, MI, USA","end":{"date-parts":[[2020,6,10]]}},"container-title":["2020 IEEE International Conference on Prognostics and Health Management (ICPHM)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9184066\/9187021\/09187046.pdf?arnumber=9187046","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T00:27:47Z","timestamp":1656376067000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9187046\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,6]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/icphm49022.2020.9187046","relation":{},"subject":[],"published":{"date-parts":[[2020,6]]}}}