{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,5]],"date-time":"2025-07-05T05:10:09Z","timestamp":1751692209898,"version":"3.41.0"},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,6,9]],"date-time":"2025-06-09T00:00:00Z","timestamp":1749427200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,6,9]],"date-time":"2025-06-09T00:00:00Z","timestamp":1749427200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000015","name":"U.S. Department of Energy","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100000015","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,6,9]]},"DOI":"10.1109\/icphm65385.2025.11062039","type":"proceedings-article","created":{"date-parts":[[2025,7,4]],"date-time":"2025-07-04T17:48:14Z","timestamp":1751651294000},"page":"1-7","source":"Crossref","is-referenced-by-count":0,"title":["Data-Driven PHM with BDPS Tool Suite: Battery Data Acquisition for Degradation Modeling"],"prefix":"10.1109","author":[{"given":"Arsh R.","family":"Nadkarni","sequence":"first","affiliation":[{"name":"Ridgetop Group Inc.,Tucson,AZ,85741"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Basab R. D.","family":"Goswami","sequence":"additional","affiliation":[{"name":"Ridgetop Group Inc.,Tucson,AZ,85741"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wyatt","family":"Pena","sequence":"additional","affiliation":[{"name":"Ridgetop Group Inc.,Tucson,AZ,85741"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Christopher","family":"Curti","sequence":"additional","affiliation":[{"name":"Ridgetop Group Inc.,Tucson,AZ,85741"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","first-page":"1","article-title":"Ieee standard framework for prognostics and health management of electronic systems","year":"2017","journal-title":"IEEE Std 1856-2017"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1039\/D2EE03019E"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2016.12.011"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2023.108271"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1038\/s41586-020-1994-5"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.seta.2024.103766"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2024.235015"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1021\/acs.jpcc.3c05395"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2024.234065"}],"event":{"name":"2025 IEEE International Conference on Prognostics and Health Management (ICPHM)","start":{"date-parts":[[2025,6,9]]},"location":"Denver, CO, USA","end":{"date-parts":[[2025,6,11]]}},"container-title":["2025 IEEE International Conference on Prognostics and Health Management (ICPHM)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11062024\/11061815\/11062039.pdf?arnumber=11062039","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,5]],"date-time":"2025-07-05T04:43:37Z","timestamp":1751690617000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11062039\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,6,9]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/icphm65385.2025.11062039","relation":{},"subject":[],"published":{"date-parts":[[2025,6,9]]}}}