{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,8]],"date-time":"2025-07-08T04:15:51Z","timestamp":1751948151443,"version":"3.41.2"},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,6,9]],"date-time":"2025-06-09T00:00:00Z","timestamp":1749427200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,6,9]],"date-time":"2025-06-09T00:00:00Z","timestamp":1749427200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100007219","name":"Natural Science Foundation of Shanghai","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100007219","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,6,9]]},"DOI":"10.1109\/icphm65385.2025.11062041","type":"proceedings-article","created":{"date-parts":[[2025,7,4]],"date-time":"2025-07-04T17:48:14Z","timestamp":1751651294000},"page":"1-7","source":"Crossref","is-referenced-by-count":0,"title":["Alternating Current Field Measurement Method for Rail Crack Detection using TMR Sensing Array"],"prefix":"10.1109","author":[{"given":"Jiaoyang","family":"Li","sequence":"first","affiliation":[{"name":"Shanghai University,School of Mechatronic Engineering and Automation,Shanghai,China,200444"}]},{"given":"Yapeng","family":"Xu","sequence":"additional","affiliation":[{"name":"Shanghai University,School of Mechatronic Engineering and Automation,Shanghai,China,200444"}]},{"given":"Lin","family":"Li","sequence":"additional","affiliation":[{"name":"Shanghai University,School of Mechatronic Engineering and Automation,Shanghai,China,200444"}]},{"given":"Hailing","family":"Xing","sequence":"additional","affiliation":[{"name":"Technical Center of Shanghai Shentong Metro Group Co., Ltd.,Shanghai,China,201103"}]},{"given":"Taotao","family":"Shan","sequence":"additional","affiliation":[{"name":"Shanghai Shentong Metro Test & Certification Co., Ltd.,Shanghai,China,201204"}]},{"given":"Huajun","family":"Wang","sequence":"additional","affiliation":[{"name":"Shenglong Oil and Gas Pipeline Inspection Technology Co., Ltd.,Shanghai,China,200949"}]},{"given":"Guanyu","family":"Piao","sequence":"additional","affiliation":[{"name":"Shanghai University,School of Mechatronic Engineering and Automation,Shanghai,China,200444"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1080\/00423114.2014.953180"},{"first-page":"5","volume-title":"UIC Safety Public Report","year":"2024","key":"ref2"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2021.3119267"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.21744\/irjeis.v7n3.1003"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1080\/10589759.2025.2483372"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2025.112680"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3390\/ma15207362"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3390\/app10196805"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-97-7255-1_5"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2012.10.001"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-97-7255-1_1"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmmm.2022.169301"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2016.01.003"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2024.114615"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3383056"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3117034"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/19.997840"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.egyr.2021.09.064"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.compstruc.2014.12.002"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108090"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1002\/tee.24061"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2013.05.004"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1080\/23746149.2022.2109431"}],"event":{"name":"2025 IEEE International Conference on Prognostics and Health Management (ICPHM)","start":{"date-parts":[[2025,6,9]]},"location":"Denver, CO, USA","end":{"date-parts":[[2025,6,11]]}},"container-title":["2025 IEEE International Conference on Prognostics and Health Management (ICPHM)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11062024\/11061815\/11062041.pdf?arnumber=11062041","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,7]],"date-time":"2025-07-07T17:47:40Z","timestamp":1751910460000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11062041\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,6,9]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/icphm65385.2025.11062041","relation":{},"subject":[],"published":{"date-parts":[[2025,6,9]]}}}