{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,5]],"date-time":"2025-07-05T05:10:09Z","timestamp":1751692209847,"version":"3.41.0"},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,6,9]],"date-time":"2025-06-09T00:00:00Z","timestamp":1749427200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,6,9]],"date-time":"2025-06-09T00:00:00Z","timestamp":1749427200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100007219","name":"Natural Science Foundation of Shanghai","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100007219","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,6,9]]},"DOI":"10.1109\/icphm65385.2025.11062045","type":"proceedings-article","created":{"date-parts":[[2025,7,4]],"date-time":"2025-07-04T17:48:14Z","timestamp":1751651294000},"page":"1-7","source":"Crossref","is-referenced-by-count":0,"title":["A Chirp-Waveform-Based Eddy Current Method for Defects Detection in Ferromagnetic Materials"],"prefix":"10.1109","author":[{"given":"Guanyu","family":"Piao","sequence":"first","affiliation":[{"name":"Shanghai University,School of Mechatronic Engineering and Automation,China,200444"}]},{"given":"Ziyan","family":"Zou","sequence":"additional","affiliation":[{"name":"Shanghai University,School of Mechatronic Engineering and Automation,China,200444"}]},{"given":"Lin","family":"Li","sequence":"additional","affiliation":[{"name":"Shanghai University,School of Mechatronic Engineering and Automation,China,200444"}]},{"given":"Jiaoyang","family":"Li","sequence":"additional","affiliation":[{"name":"Shanghai University,School of Mechatronic Engineering and Automation,China,200444"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3390\/s21248199"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.prostr.2019.08.035"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3297952"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2007.07.008"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2024.115465"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.prostr.2024.09.323"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3390\/s23042204"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2004.06.001"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s00164-001-0014-x"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2019.05.026"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s10033-017-0122-4"},{"key":"ref12","article-title":"Research on Surface Defect Detection Using Pulsed Eddy Current Testing Technology","volume-title":"IEEE Transl. Conf. Nondestruct. Test.","volume":"2008","author":"Zhou"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.3390\/app14156488"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2019.8827114"},{"key":"ref15","article-title":"Application of the pulsed eddy current technique to inspect pipelines of nuclear plants","volume-title":"IEEE Transl. Conf. Nondestruct. Test.","volume":"2008","author":"Park"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ELEKTRO.2012.6225661"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.prostr.2024.09.323"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2019.102211"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/s00164-001-0014-x"},{"volume-title":"Radar Handbook","year":"2008","author":"Skolnik","key":"ref20"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmmm.2021.168007"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-023-31478-y"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICCSN.2016.7586630"}],"event":{"name":"2025 IEEE International Conference on Prognostics and Health Management (ICPHM)","start":{"date-parts":[[2025,6,9]]},"location":"Denver, CO, USA","end":{"date-parts":[[2025,6,11]]}},"container-title":["2025 IEEE International Conference on Prognostics and Health Management (ICPHM)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11062024\/11061815\/11062045.pdf?arnumber=11062045","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,5]],"date-time":"2025-07-05T04:43:43Z","timestamp":1751690623000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11062045\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,6,9]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/icphm65385.2025.11062045","relation":{},"subject":[],"published":{"date-parts":[[2025,6,9]]}}}