{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,23]],"date-time":"2024-08-23T18:25:42Z","timestamp":1724437542546},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,5]]},"DOI":"10.1109\/icphys.2019.8780282","type":"proceedings-article","created":{"date-parts":[[2019,8,2]],"date-time":"2019-08-02T00:19:49Z","timestamp":1564705189000},"source":"Crossref","is-referenced-by-count":5,"title":["Smart Spare Part Inventory Management System with Sensor Data Updating"],"prefix":"10.1109","author":[{"given":"Jie","family":"Lin","sequence":"first","affiliation":[]},{"given":"Meimei","family":"Zheng","sequence":"additional","affiliation":[]},{"given":"Jiayu","family":"Chen","sequence":"additional","affiliation":[]},{"given":"Kai","family":"He","sequence":"additional","affiliation":[]},{"given":"Ershun","family":"Pan","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2010.11.018"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2007.03.019"},{"key":"ref12","first-page":"s0951832017303083","article-title":"Bayesian and likelihood inferences on remaining useful life in two-phase degradation models under gamma process","author":"ling","year":"2017","journal-title":"Reliability Engineering & System Safety"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1080\/07408170590929018"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1115\/1.3159045"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCA.2009.2016429"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1287\/opre.1110.0912"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2013.2241232"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1080\/07408170701730818"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1080\/00207543.2014.988892"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2007.909775"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/S0377-2217(02)00837-8"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2017.09.039"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2009.09.013"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1080\/07408179608966288"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/1757-899X\/351\/1\/012014"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2017.04.019"},{"key":"ref1","author":"barron","year":"1996","journal-title":"Engineering Condition Monitoring"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2013.10.065"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2007.03.019"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2005.05.017"}],"event":{"name":"2019 IEEE International Conference on Industrial Cyber Physical Systems (ICPS)","location":"Taipei, Taiwan","start":{"date-parts":[[2019,5,6]]},"end":{"date-parts":[[2019,5,9]]}},"container-title":["2019 IEEE International Conference on Industrial Cyber Physical Systems (ICPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8767101\/8780112\/08780282.pdf?arnumber=8780282","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,17]],"date-time":"2022-07-17T21:49:27Z","timestamp":1658094567000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8780282\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,5]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/icphys.2019.8780282","relation":{},"subject":[],"published":{"date-parts":[[2019,5]]}}}