{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:25:41Z","timestamp":1740101141601,"version":"3.37.3"},"reference-count":38,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,8,21]],"date-time":"2022-08-21T00:00:00Z","timestamp":1661040000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,8,21]],"date-time":"2022-08-21T00:00:00Z","timestamp":1661040000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100006190","name":"Research and Development","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100006190","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,8,21]]},"DOI":"10.1109\/icpr56361.2022.9956597","type":"proceedings-article","created":{"date-parts":[[2022,11,29]],"date-time":"2022-11-29T19:34:13Z","timestamp":1669750453000},"page":"3572-3579","source":"Crossref","is-referenced-by-count":0,"title":["Steel Defect Detection Based on Modified RetinaNet"],"prefix":"10.1109","author":[{"given":"Yu","family":"Zhang","sequence":"first","affiliation":[{"name":"University of Chinese Academy of Sciences,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yan","family":"Gao","sequence":"additional","affiliation":[{"name":"Agricultural Development Bank of China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Li-Yong","family":"Shen","sequence":"additional","affiliation":[{"name":"University of Chinese Academy of Sciences,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"YOLOv4 Optimal Speed and Accuracy of Object Detection","year":"2020","author":"bochkovskiy","key":"ref38"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00907"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00720"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00813"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00091"},{"journal-title":"YOLOv3 An Incremental Improvement","year":"2018","author":"redmon","key":"ref37"},{"key":"ref36","first-page":"21","article-title":"Ssd: Single shot multibox detector[C]","author":"liu","year":"2016","journal-title":"European Conference on Computer Vision"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2015.169"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref10","first-page":"693","article-title":"Enhanced performance for support vector machines as multiclass classifiers in steel surface defect detection","volume":"6","author":"amid","year":"2012","journal-title":"International Journal of Electrical and Computer Engineering"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICIEA.2012.6360951"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.apsusc.2013.09.002"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2009.01.007"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1117\/1.3102066"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2218677"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s12613-013-0690-y"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.jvcir.2015.04.005"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1155\/2016\/5797654"},{"key":"ref19","first-page":"91","article-title":"Faster r-cnn: Towards real-time object detection with region proposal networks[J]","volume":"28","author":"ren","year":"2015","journal-title":"Advances in neural information processing systems"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00913"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1093\/nar\/gkg509"},{"journal-title":"Objects as points","year":"2019","author":"zhou","key":"ref27"},{"key":"ref3","article-title":"Evaluation of Coating Thickness Using Lift-Off Insensitivity of Eddy Current Sensor[J]","volume":"21","author":"xiaobai","year":"2021","journal-title":"SENSORS"},{"key":"ref6","first-page":"1097","article-title":"Imagenet classification with deep convolutional neural networks[J]","volume":"25","author":"krizhevsky","year":"2012","journal-title":"Advances in neural information processing systems"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2019.00682"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2009.5459207"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.106"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.324"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"397","DOI":"10.1016\/j.optlaseng.2019.05.005","article-title":"A deep-learning-based approach for fast and robust steel surface defects classification","volume":"121","author":"g","year":"2019","journal-title":"Optics and Lasers in Engineering"},{"key":"ref9","first-page":"161","article-title":"Steel surface defects detection and classification using sift and voting strategy","volume":"6","author":"suvdaa","year":"2012","journal-title":"International Journal of Software Engineering and Its Applications"},{"journal-title":"Production principle and technology of plate and strip","year":"1995","author":"wang","key":"ref1"},{"key":"ref20","first-page":"779","article-title":"You only look once: Unified, real-time object detection[C]","author":"redmon","year":"2016","journal-title":"Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition"},{"key":"ref22","first-page":"2584","author":"faghih-roohi","year":"2016","journal-title":"Deep convolutional neural networks for detection of rail surface defects"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-14249-4_64"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1002\/srin.201600068"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.17222\/mit.2015.335"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.322"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2014.81"}],"event":{"name":"2022 26th International Conference on Pattern Recognition (ICPR)","start":{"date-parts":[[2022,8,21]]},"location":"Montreal, QC, Canada","end":{"date-parts":[[2022,8,25]]}},"container-title":["2022 26th International Conference on Pattern Recognition (ICPR)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9956007\/9955631\/09956597.pdf?arnumber=9956597","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,12,19]],"date-time":"2022-12-19T20:04:18Z","timestamp":1671480258000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9956597\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,8,21]]},"references-count":38,"URL":"https:\/\/doi.org\/10.1109\/icpr56361.2022.9956597","relation":{},"subject":[],"published":{"date-parts":[[2022,8,21]]}}}