{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:08:21Z","timestamp":1740100101023,"version":"3.37.3"},"reference-count":27,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,5,10]],"date-time":"2021-05-10T00:00:00Z","timestamp":1620604800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,5,10]],"date-time":"2021-05-10T00:00:00Z","timestamp":1620604800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,5,10]],"date-time":"2021-05-10T00:00:00Z","timestamp":1620604800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51775452,51905452"],"award-info":[{"award-number":["51775452,51905452"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2019M663549"],"award-info":[{"award-number":["2019M663549"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,5,10]]},"DOI":"10.1109\/icps49255.2021.9468218","type":"proceedings-article","created":{"date-parts":[[2021,7,5]],"date-time":"2021-07-05T20:39:55Z","timestamp":1625517595000},"page":"661-666","source":"Crossref","is-referenced-by-count":2,"title":["A Transfer Learning Based Method for Incipient Fault Detection"],"prefix":"10.1109","author":[{"given":"Changgen","family":"Li","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Liang","family":"Guo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hongli","family":"Gao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Junhao","family":"Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xun","family":"Dong","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhichao","family":"You","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.renene.2019.06.094"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3901\/CJME.2014.1103.166"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.21595\/jve.2017.17768"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2016.10.013"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2013.2265316"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2014.09.025"},{"key":"ref16","first-page":"1","article-title":"Deep Coupled Joint Distribution Adaptation Network: A Method for Intelligent Fault Diagnosis Between Artificial and Real Damages","volume":"70","author":"tan","year":"2020","journal-title":"IEEE Trans Instrum Meas"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2733438"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2018.12.016"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2800978"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2058072"},{"journal-title":"Very Deep Convolutional Networks for Large-scale Image Recognition","year":"2014","author":"simonyan","key":"ref27"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2877090"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2018.09.008"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2019.05.099"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s12206-019-0303-4"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2017.12.008"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2020.106681"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2017.08.640"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.wear.2020.203479"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2019.107278"},{"key":"ref22","volume":"1","author":"goodfellow","year":"2016","journal-title":"Deep Learning"},{"key":"ref21","first-page":"1951","article-title":"Deep Residual Learning for Image Recognition Kaiming","volume":"45","author":"he","year":"2016","journal-title":"CVPR2016"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2012.10.013"},{"key":"ref23","article-title":"A hybrid prognostics approach for estimating remaining useful life of rolling element bearings","author":"wang","year":"2018","journal-title":"IEEE Trans Reliab"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ICDM.2008.17"},{"key":"ref25","first-page":"802","article-title":"A novel model of one-class bearing fault detection using SVDD and genetic algorithm","author":"tao","year":"0","journal-title":"2007 2nd IEEE Conference on Industrial Electronics and Applications"}],"event":{"name":"2021 4th IEEE International Conference on Industrial Cyber-Physical Systems (ICPS)","start":{"date-parts":[[2021,5,10]]},"location":"Victoria, BC, Canada","end":{"date-parts":[[2021,5,12]]}},"container-title":["2021 4th IEEE International Conference on Industrial Cyber-Physical Systems (ICPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9467798\/9468113\/09468218.pdf?arnumber=9468218","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T15:46:08Z","timestamp":1652197568000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9468218\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,5,10]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/icps49255.2021.9468218","relation":{},"subject":[],"published":{"date-parts":[[2021,5,10]]}}}