{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,28]],"date-time":"2025-09-28T15:08:35Z","timestamp":1759072115796},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/icra.2013.6630586","type":"proceedings-article","created":{"date-parts":[[2013,10,21]],"date-time":"2013-10-21T22:11:25Z","timestamp":1382393485000},"source":"Crossref","is-referenced-by-count":15,"title":["A novel virtual metrology scheme for predicting machining precision of machine tools"],"prefix":"10.1109","author":[{"given":"Hao","family":"Tieng","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Haw-Ching","family":"Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Min-Hsiung","family":"Hung","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fan-Tien","family":"Cheng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/CONIEL.2005.6"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1016\/S0169-7439(01)00155-1"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2007.907633"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2011.2169405"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-011-3353-z"},{"key":"2","doi-asserted-by":"crossref","first-page":"49","DOI":"10.4028\/www.scientific.net\/AMR.498.49","article-title":"Comparison between a laser micrometer and a touch trigger probe for workpiece measurement on a cnc lathe","author":"valin?o","year":"2012","journal-title":"Advanced Materials Research"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1504\/IJPTECH.2010.031657"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2007.914373"},{"key":"7","article-title":"International technology roadmap for semiconductors (itrs) perspective on aec\/apc","author":"moyne","year":"2009","journal-title":"ISMI AEC\/APC Symposium XXI-North America 2009"},{"key":"6","first-page":"1","article-title":"Run-to-run control utilizing the avm system in the solar industry","author":"lin","year":"2011","journal-title":"2011 IEEE Inter Sym On Semiconductor Manufacturing (ISSM) and E-Manufacturing and Design Collaboration (EMDC)"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2011.2154910"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1016\/j.rcim.2012.01.002"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2011.2154910"},{"key":"8","article-title":"ISMI next generation factory","author":"rothe","year":"2008","journal-title":"E-Manufacturing Workshop"}],"event":{"name":"2013 IEEE International Conference on Robotics and Automation (ICRA)","location":"Karlsruhe, Germany","start":{"date-parts":[[2013,5,6]]},"end":{"date-parts":[[2013,5,10]]}},"container-title":["2013 IEEE International Conference on Robotics and Automation"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6615630\/6630547\/06630586.pdf?arnumber=6630586","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,22]],"date-time":"2017-06-22T00:19:26Z","timestamp":1498090766000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6630586\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/icra.2013.6630586","relation":{},"subject":[],"published":{"date-parts":[[2013,5]]}}}