{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,1]],"date-time":"2025-10-01T15:19:27Z","timestamp":1759331967631,"version":"3.40.3"},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,12,16]],"date-time":"2024-12-16T00:00:00Z","timestamp":1734307200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,12,16]],"date-time":"2024-12-16T00:00:00Z","timestamp":1734307200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,12,16]]},"DOI":"10.1109\/icrc64395.2024.10937018","type":"proceedings-article","created":{"date-parts":[[2025,3,28]],"date-time":"2025-03-28T03:23:48Z","timestamp":1743132228000},"page":"1-9","source":"Crossref","is-referenced-by-count":1,"title":["Exploration of the viability of TiN\/TiO<sub>X<\/sub> ReRAM in Computational Random-Access Memory (CRAM)"],"prefix":"10.1109","author":[{"given":"Brandon R.","family":"Zink","sequence":"first","affiliation":[{"name":"National Institute of Standards and Technology,Alternative Computing Group,Gaithersburg,MD"}]},{"given":"Advait","family":"Madhavan","sequence":"additional","affiliation":[{"name":"National Institute of Standards and Technology,Alternative Computing Group,Gaithersburg,MD"}]},{"given":"William A.","family":"Borders","sequence":"additional","affiliation":[{"name":"National Institute of Standards and Technology,Alternative Computing Group,Gaithersburg,MD"}]},{"given":"Jabez","family":"McClelland","sequence":"additional","affiliation":[{"name":"National Institute of Standards and Technology,Alternative Computing Group,Gaithersburg,MD"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IISWC.2013.6704670"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IISWC.2014.6983056"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/3296957.3173177"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/PACT.2015.22"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2019.00018"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-023-01053-4"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1038\/nature08940"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2014.2357292"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201802554"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2022.3171765"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2018.2858251"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/LCA.2017.2751042"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2019.8697377"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/3475963"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1038\/s44335-024-00003-3"},{"key":"ref16","first-page":"T166","article-title":"Self-rectifying bipolar TaOX\/TiO2 RRAM with superior endurance over 1012 cycles for 3D high-density storage-class memory","volume-title":"Symp. VLSI Technol","author":"Hsu"},{"key":"ref17","article-title":"Investigation of key performance metrics in TiOX\/TiN based resistive random-access memory cells","author":"Zink"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1063\/1.4719198"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/IMW.2015.7150281"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2014.2375200"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1063\/1.3524521"}],"event":{"name":"2024 IEEE International Conference on Rebooting Computing (ICRC)","location":"San Diego, CA, USA","start":{"date-parts":[[2024,12,16]]},"end":{"date-parts":[[2024,12,17]]}},"container-title":["2024 IEEE International Conference on Rebooting Computing (ICRC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10936635\/10936996\/10937018.pdf?arnumber=10937018","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,29]],"date-time":"2025-03-29T03:08:59Z","timestamp":1743217739000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10937018\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,12,16]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/icrc64395.2024.10937018","relation":{},"subject":[],"published":{"date-parts":[[2024,12,16]]}}}