{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,24]],"date-time":"2025-11-24T23:43:30Z","timestamp":1764027810118},"reference-count":0,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,12,18]],"date-time":"2023-12-18T00:00:00Z","timestamp":1702857600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,12,18]],"date-time":"2023-12-18T00:00:00Z","timestamp":1702857600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,12,18]]},"DOI":"10.1109\/icsc58660.2023.10449698","type":"proceedings-article","created":{"date-parts":[[2024,3,4]],"date-time":"2024-03-04T14:00:33Z","timestamp":1709560833000},"page":"01-05","source":"Crossref","is-referenced-by-count":1,"title":["Numerical Elucidation of the Electrothermal Characteristics of Gate-All-Around FET Devices"],"prefix":"10.1109","author":[{"given":"Faouzi","family":"Nasri","sequence":"first","affiliation":[{"name":"CRTEn Borj-Cedria Tunisia and with Research Center for Microelectronics and Nanotechnology,Laboratory of thermal processes,Sousse,Tunisia"}]},{"given":"Husien","family":"Salama","sequence":"additional","affiliation":[{"name":"Computer System Institute,Boston,USA"}]}],"member":"263","event":{"name":"2023 IEEE 11th International Conference on Systems and Control (ICSC)","start":{"date-parts":[[2023,12,18]]},"location":"Sousse, Tunisia","end":{"date-parts":[[2023,12,20]]}},"container-title":["2023 IEEE 11th International Conference on Systems and Control (ICSC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10449691\/10449692\/10449698.pdf?arnumber=10449698","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,4]],"date-time":"2024-03-04T14:01:08Z","timestamp":1709560868000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10449698\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,12,18]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/icsc58660.2023.10449698","relation":{},"subject":[],"published":{"date-parts":[[2023,12,18]]}}}