{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,1]],"date-time":"2026-07-01T04:03:23Z","timestamp":1782878603943,"version":"3.54.5"},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009]]},"DOI":"10.1109\/icse.2009.5070508","type":"proceedings-article","created":{"date-parts":[[2009,6,10]],"date-time":"2009-06-10T14:24:29Z","timestamp":1244643869000},"page":"56-66","source":"Crossref","is-referenced-by-count":193,"title":["Lightweight fault-localization using multiple coverage types"],"prefix":"10.1109","author":[{"given":"Raul","family":"Santelices","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"James A.","family":"Jones","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"family":"Yanbing Yu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mary Jean","family":"Harrold","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/1065010.1065014"},{"key":"ref11","first-page":"286","article-title":"SOBER: statistical model-based bug localization","author":"liu","year":"2005","journal-title":"Proc European Software Eng Conf Foundations of Software Eng"},{"key":"ref12","article-title":"Fault localization based on information flow coverage","author":"masri","year":"2007","journal-title":"Technical report AUB-CMPS-07–10"},{"key":"ref13","first-page":"156","article-title":"Demand-driven structural testing with dynamic instrumentation","author":"misurda","year":"2005","journal-title":"Proc Int l Conf Software Engineering"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/566172.566182"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2003.1240292"},{"key":"ref16","first-page":"343","article-title":"Efficiently monitoring dataflow test coverage","author":"santelices","year":"2007","journal-title":"Proc of Int'l Conf on Automated Softw Eng"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.1996.566449"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/1390630.1390654"},{"key":"ref6","first-page":"528","article-title":"Lightweight defect localization for java","author":"dallmeier","year":"2005","journal-title":"Proceedings of European Conference of Object-Oriented Programming"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/1062455.1062522"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/1101908.1101949"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.1994.296778"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.1995.497652"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TAIC.PART.2007.13"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/581396.581397"}],"event":{"name":"2009 IEEE 31st International Conference on Software Engineering","location":"Vancouver, BC, Canada","start":{"date-parts":[[2009,5,16]]},"end":{"date-parts":[[2009,5,24]]}},"container-title":["2009 IEEE 31st International Conference on Software Engineering"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5062304\/5070493\/05070508.pdf?arnumber=5070508","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T00:03:49Z","timestamp":1489795429000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5070508\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/icse.2009.5070508","relation":{},"subject":[],"published":{"date-parts":[[2009]]}}}