{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T19:11:39Z","timestamp":1725736299456},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,10]]},"DOI":"10.1109\/icsens.2016.7808403","type":"proceedings-article","created":{"date-parts":[[2017,1,11]],"date-time":"2017-01-11T18:14:24Z","timestamp":1484158464000},"page":"1-3","source":"Crossref","is-referenced-by-count":3,"title":["Temperature and pressure characterization of the quality factor in a CMOS-MEMS resonator"],"prefix":"10.1109","author":[{"given":"Saoni","family":"Banerji","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jordi","family":"Madrenas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Daniel","family":"Fernandez","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1049\/el.2015.0140"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2008.924253"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1155\/2010\/937301"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/s00542-016-2878-3"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s11340-007-9076-2"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2015.12.003"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MEMSYS.2010.5442531"}],"event":{"name":"2016 IEEE SENSORS","start":{"date-parts":[[2016,10,30]]},"location":"Orlando, FL, USA","end":{"date-parts":[[2016,11,3]]}},"container-title":["2016 IEEE SENSORS"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7777313\/7808393\/07808403.pdf?arnumber=7808403","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,1,21]],"date-time":"2017-01-21T00:06:11Z","timestamp":1484957171000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7808403\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,10]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/icsens.2016.7808403","relation":{},"subject":[],"published":{"date-parts":[[2016,10]]}}}