{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T08:47:37Z","timestamp":1729673257628,"version":"3.28.0"},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,10]]},"DOI":"10.1109\/icsens.2016.7808724","type":"proceedings-article","created":{"date-parts":[[2017,1,11]],"date-time":"2017-01-11T23:14:24Z","timestamp":1484176464000},"page":"1-3","source":"Crossref","is-referenced-by-count":1,"title":["Detection of conductive objects with electrical capacitance tomography"],"prefix":"10.1109","author":[{"given":"Stephan","family":"Muhlbacher-Karrer","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hubert","family":"Zangl","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2238034"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"1579","DOI":"10.21307\/ijssis-2017-721","article-title":"Simulation of the leakage effect in capacitive sensors","volume":"7","author":"schlegl","year":"2014","journal-title":"International Journal on Smart Sensing and Intelligent Systems"},{"key":"ref10","doi-asserted-by":"crossref","first-page":"211","DOI":"10.1111\/j.2517-6161.1964.tb00553.x","article-title":"An analysis of transformations","author":"box","year":"1964","journal-title":"Journal of the Royal Statistical Society Series B (Methodological)"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2021645"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/450\/1\/012018"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1049\/ip-g-2.1992.0015"},{"journal-title":"Statistical and Computational Inverse Problems","year":"2004","author":"kaipio","key":"ref8"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1108\/COMPEL-02-2015-0094"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/SAS.2015.7133574"},{"key":"ref9","article-title":"Non-iterative reconstruction for electrical tomography using optimal first and second order approximations","author":"zangl","year":"2007","journal-title":"5th World Congress on Industrial Process Tomography"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/14\/1\/201"}],"event":{"name":"2016 IEEE SENSORS","start":{"date-parts":[[2016,10,30]]},"location":"Orlando, FL, USA","end":{"date-parts":[[2016,11,3]]}},"container-title":["2016 IEEE SENSORS"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7777313\/7808393\/07808724.pdf?arnumber=7808724","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,9,17]],"date-time":"2019-09-17T12:13:32Z","timestamp":1568722412000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7808724\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,10]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/icsens.2016.7808724","relation":{},"subject":[],"published":{"date-parts":[[2016,10]]}}}