{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,23]],"date-time":"2025-05-23T21:22:01Z","timestamp":1748035321119},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,10]]},"DOI":"10.1109\/icsens.2016.7808826","type":"proceedings-article","created":{"date-parts":[[2017,1,11]],"date-time":"2017-01-11T18:14:24Z","timestamp":1484158464000},"page":"1-3","source":"Crossref","is-referenced-by-count":5,"title":["Noise and impedance of the SIROF utah electrode array"],"prefix":"10.1109","author":[{"given":"Mohit","family":"Sharma","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Avery Tye","family":"Gardner","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jason","family":"Silver","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ross M.","family":"Walker","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1515\/bmte.2002.47.s1b.514"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/EMBC.2012.6346042"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRev.32.110"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IEMBS.2004.1404158"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s10544-010-9434-1"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/10.846685"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1149\/1.2085829"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1149\/1.2119793"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1088\/1741-2560\/4\/4\/007"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1063\/1.1755429"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2005.847523"}],"event":{"name":"2016 IEEE SENSORS","start":{"date-parts":[[2016,10,30]]},"location":"Orlando, FL, USA","end":{"date-parts":[[2016,11,3]]}},"container-title":["2016 IEEE SENSORS"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7777313\/7808393\/07808826.pdf?arnumber=7808826","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,1,20]],"date-time":"2017-01-20T06:36:41Z","timestamp":1484894201000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7808826\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,10]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/icsens.2016.7808826","relation":{},"subject":[],"published":{"date-parts":[[2016,10]]}}}