{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T13:07:14Z","timestamp":1762002434337,"version":"build-2065373602"},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,10]]},"DOI":"10.1109\/icsens.2017.8234043","type":"proceedings-article","created":{"date-parts":[[2018,1,2]],"date-time":"2018-01-02T22:47:51Z","timestamp":1514933271000},"page":"1-3","source":"Crossref","is-referenced-by-count":9,"title":["3D MOS-capacitor-based ionizing radiation sensors"],"prefix":"10.1109","author":[{"given":"Yi","family":"Xuan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Charilaos","family":"Mousoulis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Anurag","family":"Kumar","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Christian I.","family":"Elmiger","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sean","family":"Scott","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Daniel J.","family":"Valentino","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dimitrios","family":"Peroulis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.radmeas.2014.03.023"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1038\/jid.2011.411"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/EuMC.2015.7345861"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.radmeas.2014.01.009"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICSENS.2016.7808645"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICSENS.2015.7370515"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.radi.2011.07.003"},{"key":"ref1","article-title":"Semiconductor device fundamentals","author":"pierret","year":"1996","journal-title":"Addison-Wesley Reading MASS"}],"event":{"name":"2017 IEEE SENSORS","start":{"date-parts":[[2017,10,29]]},"location":"Glasgow","end":{"date-parts":[[2017,11,1]]}},"container-title":["2017 IEEE SENSORS"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8169642\/8233862\/08234043.pdf?arnumber=8234043","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,2,7]],"date-time":"2018-02-07T21:42:44Z","timestamp":1518039764000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8234043\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,10]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/icsens.2017.8234043","relation":{},"subject":[],"published":{"date-parts":[[2017,10]]}}}