{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,18]],"date-time":"2025-12-18T14:02:48Z","timestamp":1766066568682},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,12]]},"DOI":"10.1109\/icsenst.2015.7438462","type":"proceedings-article","created":{"date-parts":[[2016,3,30]],"date-time":"2016-03-30T00:53:09Z","timestamp":1459299189000},"page":"565-569","source":"Crossref","is-referenced-by-count":2,"title":["Electrical Capacitance Tomography with a variable topology"],"prefix":"10.1109","author":[{"given":"Stephan","family":"Muhlbacher-Karrer","sequence":"first","affiliation":[]},{"given":"Hubert","family":"Zangl","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/26\/6\/065401"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1049\/ip-g-2.1992.0015"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/16\/10\/014"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2001.931960"},{"key":"ref14","article-title":"Statistical and Computational Inverse Problems","author":"kaipio","year":"2004","journal-title":"Applied Mathematical Sciences"},{"key":"ref15","first-page":"216","article-title":"Noniterative reconstruction for electrical tomography using optimal first and second order approximations","author":"zangl","year":"2007","journal-title":"Proc 5th World Congr Ind Process Tomogr"},{"key":"ref16","article-title":"Artefact reduction in fast Bayesian inversion in electrical tomography","author":"zangl","year":"0","journal-title":"COMPEL-The international journal for computation and mathematics in electrical and electronic engineering (in press)"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.2307\/2348250"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/IROS.2013.6697134"},{"article-title":"Open environment capacitive sensing for safety applications","year":"2014","author":"schlegl","key":"ref19"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/7\/3\/013"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/14\/1\/201"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-17943-3_4"},{"article-title":"Imaging Industrial Flows: Applications of Electrical Process Tomography","year":"1995","author":"plaskowski","key":"ref5"},{"key":"ref8","article-title":"Object detection based on electrical capacitance tomography","author":"muhlbachcr-karrer","year":"2015","journal-title":"IEEE Sensors Applications Symposium"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2238034"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1049\/ip-g-2.1992.0015"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.flowmeasinst.2005.02.017"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2014.2383491"}],"event":{"name":"2015 9th International Conference on Sensing Technology (ICST)","start":{"date-parts":[[2015,12,8]]},"location":"Auckland","end":{"date-parts":[[2015,12,10]]}},"container-title":["2015 9th International Conference on Sensing Technology (ICST)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7428381\/7438351\/07438462.pdf?arnumber=7438462","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T11:58:22Z","timestamp":1490097502000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7438462\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,12]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/icsenst.2015.7438462","relation":{},"subject":[],"published":{"date-parts":[[2015,12]]}}}