{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,6]],"date-time":"2025-11-06T12:16:59Z","timestamp":1762431419436,"version":"3.28.0"},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,12]]},"DOI":"10.1109\/icsenst.2017.8304431","type":"proceedings-article","created":{"date-parts":[[2018,3,2]],"date-time":"2018-03-02T18:51:50Z","timestamp":1520016710000},"page":"1-6","source":"Crossref","is-referenced-by-count":6,"title":["Real-time monitoring of powder blend composition using near infrared spectroscopy"],"prefix":"10.1109","author":[{"given":"Niall","family":"O'Mahony","sequence":"first","affiliation":[]},{"given":"Trevor","family":"Murphy","sequence":"additional","affiliation":[]},{"given":"Krishna","family":"Panduru","sequence":"additional","affiliation":[]},{"given":"Daniel","family":"Riordan","sequence":"additional","affiliation":[]},{"given":"Joseph","family":"Walsh","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.aca.2007.02.050"},{"key":"ref11","article-title":"Principle component analysis and partial least squares: Two dimension reduction techniques for regression","volume":"79","author":"maitra","year":"2008","journal-title":"Applying Multivariate Statistical Models"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1255\/jnirs.711"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.aca.2011.03.006"},{"journal-title":"Partial Least Squares - MATLAB & Simulink - MathWorks United Kingdom","year":"0","key":"ref14"},{"key":"ref15","article-title":"Combining genetic algorithms and neural networks: The encoding problem","author":"koehn","year":"1994","journal-title":"Univ Tennessee"},{"key":"ref16","first-page":"20","article-title":"Machine Learning Algorithms for Process Analytical Technology","author":"mahony","year":"2016","journal-title":"World Congress on Industrial Control Systems Security"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISSC.2016.7528449"},{"key":"ref18","article-title":"Computational Fluid Dynamics, Rapid Prototyping and Design of Materials Sampling Processes for PAT","author":"murphy","year":"0","journal-title":"33rd International Manufacturing Conference (IMC33) 2016"},{"journal-title":"U3D» Equipment","year":"0","key":"ref19"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1002\/jps.24594"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.2116\/analsci.28.545"},{"journal-title":"New pharmaceutical applications involving Near Infrared spectroscopy as a PAT compliant process analyzer","year":"2012","author":"mantanus","key":"ref6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpba.2016.02.006"},{"key":"ref8","article-title":"Fibre-optic sensors for Process Analytical Technology","author":"mahony","year":"2016","journal-title":"33rd International Manufacturing Conference (IMC33) 2016"},{"key":"ref7","article-title":"NIR Spectroscopy - A guide to near-infrared spectroscopic analysis of industrial manufaturing processes","author":"metrohm","year":"2013","journal-title":"METRO AG"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.5772\/15212"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.aca.2011.03.048"},{"key":"ref9","first-page":"18","article-title":"Chemometrics and PAT: What Does it all Mean?","author":"workman","year":"2005","journal-title":"Role Spectrosc Process Anal Technol"},{"journal-title":"Eigenvector Research Chemometrics Software Consulting and Training","year":"0","key":"ref20"},{"journal-title":"Svm - Eigenvector Documentation Wiki","year":"0","key":"ref22"},{"journal-title":"Ann - Eigenvector Documentation Wiki","year":"0","key":"ref21"}],"event":{"name":"2017 Eleventh International Conference on Sensing Technology (ICST)","start":{"date-parts":[[2017,12,4]]},"location":"Sydney, NSW","end":{"date-parts":[[2017,12,6]]}},"container-title":["2017 Eleventh International Conference on Sensing Technology (ICST)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8301141\/8304414\/08304431.pdf?arnumber=8304431","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,4,11]],"date-time":"2018-04-11T17:40:17Z","timestamp":1523468417000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8304431\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,12]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/icsenst.2017.8304431","relation":{},"subject":[],"published":{"date-parts":[[2017,12]]}}}