{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,21]],"date-time":"2025-04-21T18:10:02Z","timestamp":1745259002395,"version":"3.40.4"},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2010,10,1]],"date-time":"2010-10-01T00:00:00Z","timestamp":1285891200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2010,10,1]],"date-time":"2010-10-01T00:00:00Z","timestamp":1285891200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,10]]},"DOI":"10.1109\/icsmc.2010.5642482","type":"proceedings-article","created":{"date-parts":[[2010,11,30]],"date-time":"2010-11-30T21:35:53Z","timestamp":1291152953000},"page":"1449-1454","source":"Crossref","is-referenced-by-count":0,"title":["A novel image quality metric based on morphological component analysis"],"prefix":"10.1109","author":[{"family":"Xuelong Li","sequence":"first","affiliation":[{"name":"Center for OPTical IMagery Analysis and Learning (OPTIMAL), State Key Laboratory of Transient Optics and Photonics, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, 710119, Shaanxi, China"}]},{"family":"Lihuo He","sequence":"additional","affiliation":[{"name":"VIPS Lab and Key Laboratory of Intelligent Perception and Image Understanding of Ministry of Education of China, School of Electronic Engineering, Xidian University, Xi'an 710071, China"}]},{"family":"Wen Lu","sequence":"additional","affiliation":[{"name":"VIPS Lab and Key Laboratory of Intelligent Perception and Image Understanding of Ministry of Education of China, School of Electronic Engineering, Xidian University, Xi'an 710071, China"}]},{"family":"Xinbo Gao","sequence":"additional","affiliation":[{"name":"VIPS Lab and Key Laboratory of Intelligent Perception and Image Understanding of Ministry of Education of China, School of Electronic Engineering, Xidian University, Xi'an 710071, China"}]},{"family":"Dacheng Tao","sequence":"additional","affiliation":[{"name":"School of Computer Engineering, Nanyang Technological University, Singapore 639798"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/83.988955"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.jvcir.2007.06.001"},{"journal-title":"Image and Video Quality Assessment Research at LIVE","year":"2003","author":"sheikh","key":"ref12"},{"journal-title":"Final report from the Video Quality Experts Group (VQEG) on the Validation of Objective Moiels of Viseo Quality Assessment Phase II VQEG","year":"2003","key":"ref13"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/83.841940"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2009.10.012"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2003.819861"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2007.901820"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2007.906256"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2005.852206"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2009.2018014"},{"key":"ref1","doi-asserted-by":"crossref","DOI":"10.1007\/978-3-031-02238-8","author":"wang","year":"2006","journal-title":"Modem Image Quality Assessment"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1117\/12.274510"}],"event":{"name":"2010 IEEE International Conference on Systems, Man and Cybernetics - SMC","start":{"date-parts":[[2010,10,10]]},"location":"Istanbul, Turkey","end":{"date-parts":[[2010,10,13]]}},"container-title":["2010 IEEE International Conference on Systems, Man and Cybernetics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5629466\/5641665\/05642482.pdf?arnumber=5642482","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,4,21]],"date-time":"2025-04-21T17:36:16Z","timestamp":1745256976000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/5642482\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,10]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/icsmc.2010.5642482","relation":{},"subject":[],"published":{"date-parts":[[2010,10]]}}}