{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,1]],"date-time":"2025-04-01T09:46:17Z","timestamp":1743500777491,"version":"3.28.0"},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,11,22]],"date-time":"2023-11-22T00:00:00Z","timestamp":1700611200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,11,22]],"date-time":"2023-11-22T00:00:00Z","timestamp":1700611200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62073009"],"award-info":[{"award-number":["62073009"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2022M710314"],"award-info":[{"award-number":["2022M710314"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,11,22]]},"DOI":"10.1109\/icsrs59833.2023.10381159","type":"proceedings-article","created":{"date-parts":[[2024,1,8]],"date-time":"2024-01-08T19:33:05Z","timestamp":1704742385000},"page":"132-136","source":"Crossref","is-referenced-by-count":1,"title":["Performance Consistency Metric Considering Two-Dimensional Performance Characterization for IGBTs"],"prefix":"10.1109","author":[{"given":"Yubing","family":"Chen","sequence":"first","affiliation":[{"name":"School of Reliability and Systems Engineering, Beihang University,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Meilin","family":"Wen","sequence":"additional","affiliation":[{"name":"School of Reliability and Systems Engineering, Beihang University,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Qingyuan","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Aeronautic Science and Engineering, Beihang University,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dong","family":"Zhang","sequence":"additional","affiliation":[{"name":"Beijing Lanwei Technology Co., Ltd.,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rui","family":"Kang","sequence":"additional","affiliation":[{"name":"School of Reliability and Systems Engineering, Beihang University,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2011.2124436"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3049738"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/63.892840"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ESARS-ITEC.2018.8607593"},{"key":"ref5","article-title":"Experimental research on current sharing characteristics of parallel press pack IGBT chips","author":"Peng","year":"2022","journal-title":"Baoding: North China Electric Power University"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2014.6803502"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2408054"},{"issue":"4","key":"ref8","first-page":"281","article-title":"Consistency analysis characteristic parameters of SiC MOSFETs","volume":"47","author":"Du","year":"2022","journal-title":"Semiconductor Technology"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2312335"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2010.2040634"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2222415"}],"event":{"name":"2023 7th International Conference on System Reliability and Safety (ICSRS)","start":{"date-parts":[[2023,11,22]]},"location":"Bologna, Italy","end":{"date-parts":[[2023,11,24]]}},"container-title":["2023 7th International Conference on System Reliability and Safety (ICSRS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10380806\/10380972\/10381159.pdf?arnumber=10381159","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,24]],"date-time":"2024-01-24T04:54:15Z","timestamp":1706072055000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10381159\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,11,22]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/icsrs59833.2023.10381159","relation":{},"subject":[],"published":{"date-parts":[[2023,11,22]]}}}