{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T20:50:05Z","timestamp":1725742205350},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,12,17]],"date-time":"2023-12-17T00:00:00Z","timestamp":1702771200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,12,17]],"date-time":"2023-12-17T00:00:00Z","timestamp":1702771200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,12,17]]},"DOI":"10.1109\/icst59744.2023.10460805","type":"proceedings-article","created":{"date-parts":[[2024,3,19]],"date-time":"2024-03-19T18:08:22Z","timestamp":1710871702000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["Self-Controlled Robust Digital Readout Circuit for Resistance Measurement: Enhancing Immunity to Circuit Nonidealities"],"prefix":"10.1109","author":[{"given":"Elangovan","family":"K","sequence":"first","affiliation":[{"name":"Digital University Kerala,School of Electronic Systems and Automation,Thiruvananthapuram,India"}]}],"member":"263","reference":[{"volume-title":"Application Notes for Temperature sensor, Minco","key":"ref1"},{"volume-title":"Application Notes for RTD sensor, TE Connectivity","key":"ref2"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3390\/s21010318"},{"volume-title":"Sensors and Signal Conditioning","year":"2000","author":"Areny","key":"ref4"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2972048"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/SAS48726.2020.9220031"},{"key":"ref7","first-page":"1","article-title":"Relaxation Oscillator Based Digital Interface Circuit for Resistive Sensors","volume-title":"IEEE 17th India Council Inter. Conf. (INDICON)","author":"Elangovan"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1515\/mms-2016-0020"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2958583"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.2971315"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3219492"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2712918"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2928348"},{"volume-title":"T & P Instruments. Technical Information Bulletin","key":"ref14"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1063\/1.4919907"}],"event":{"name":"2023 16th International Conference on Sensing Technology (ICST)","start":{"date-parts":[[2023,12,17]]},"location":"HYDERABAD, India","end":{"date-parts":[[2023,12,20]]}},"container-title":["2023 16th International Conference on Sensing Technology (ICST)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10460767\/10460768\/10460805.pdf?arnumber=10460805","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,26]],"date-time":"2024-03-26T19:25:23Z","timestamp":1711481123000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10460805\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,12,17]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/icst59744.2023.10460805","relation":{},"subject":[],"published":{"date-parts":[[2023,12,17]]}}}