{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,17]],"date-time":"2026-07-17T15:48:31Z","timestamp":1784303311530,"version":"3.55.0"},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,3,31]],"date-time":"2025-03-31T00:00:00Z","timestamp":1743379200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,3,31]],"date-time":"2025-03-31T00:00:00Z","timestamp":1743379200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,3,31]]},"DOI":"10.1109\/icst62969.2025.10989045","type":"proceedings-article","created":{"date-parts":[[2025,5,20]],"date-time":"2025-05-20T17:05:21Z","timestamp":1747760721000},"page":"801-804","source":"Crossref","is-referenced-by-count":16,"title":["ICST Tool Competition 2025 - Self-Driving Car Testing Track"],"prefix":"10.1109","author":[{"given":"Christian","family":"Birchler","sequence":"first","affiliation":[{"name":"University of Bern,Switzerland"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Stefan","family":"Klikovits","sequence":"additional","affiliation":[{"name":"Johannes Keppler University,Linz,Austria"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mattia","family":"Fazzini","sequence":"additional","affiliation":[{"name":"University of Minnesota,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sebastiano","family":"Panichella","sequence":"additional","affiliation":[{"name":"University of Bern,Switzerland"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/icst57152.2023.00034"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1002\/stv.430"},{"key":"ref3","author":"Birchler","year":"2025","journal-title":"Icst 2025 sdc tool competition results"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/3643991.3644891"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/3526072.3527531"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/3526072.3527538"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/sbst52555.2021.00016"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/sbst52555.2021.00011"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/3526072.3527532"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tse.2023.3243522"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/3643768"}],"event":{"name":"2025 IEEE Conference on Software Testing, Verification and Validation (ICST)","location":"Napoli, Italy","start":{"date-parts":[[2025,3,31]]},"end":{"date-parts":[[2025,4,4]]}},"container-title":["2025 IEEE Conference on Software Testing, Verification and Validation (ICST)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10988917\/10988918\/10989045.pdf?arnumber=10989045","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T06:06:31Z","timestamp":1747807591000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10989045\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,3,31]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/icst62969.2025.10989045","relation":{},"subject":[],"published":{"date-parts":[[2025,3,31]]}}}