{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,17]],"date-time":"2026-07-17T06:09:57Z","timestamp":1784268597472,"version":"3.55.0"},"reference-count":25,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,5,18]],"date-time":"2026-05-18T00:00:00Z","timestamp":1779062400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,5,18]],"date-time":"2026-05-18T00:00:00Z","timestamp":1779062400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,5,18]]},"DOI":"10.1109\/icst69053.2026.00066","type":"proceedings-article","created":{"date-parts":[[2026,7,16]],"date-time":"2026-07-16T21:48:20Z","timestamp":1784238500000},"page":"475-485","source":"Crossref","is-referenced-by-count":0,"title":["Isolating Feature Transition Errors in Dynamically Adaptive Systems"],"prefix":"10.1109","author":[{"given":"Pierre","family":"Martou","sequence":"first","affiliation":[{"name":"ICTEAM\/ UCLouvain,Belgium"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Beno\u00eet","family":"Duhoux","sequence":"additional","affiliation":[{"name":"ICTEAM\/ UCLouvain,Belgium"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Kim","family":"Mens","sequence":"additional","affiliation":[{"name":"ICTEAM\/ UCLouvain,Belgium"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/1883612.1883618"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/SEW.2002.1199454"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICSTW58534.2023.00030"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/3634713.3634726"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2024.112260"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE48619.2023.00062"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/581396.581397"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2003.1240292"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/32.988498"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2018.2865935"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICSTW60967.2024.00046"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-51963-0_35"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-30985-5_18"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2021.3113859"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/3728917"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.21236\/ada235785"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/1639950.1640002"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2013.10.010"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.is.2010.01.001"},{"key":"ref20","first-page":"231","article-title":"Sat-based analysis of feature models is easy","volume-title":"Proceedings of the 13th International Software Product Line Conference","author":"Mendonca"},{"key":"ref21","article-title":"On cnf conversion for disjoint sat enumeration","volume-title":"26th International Conference on Theory and Applications of Satisfiability Testing (SAT 2023)","author":"Masina"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-78800-3_24"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/3555776.3577703"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2009.253"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2015.86"}],"event":{"name":"2026 IEEE International Conference on Software Testing, Verification and Validation (ICST)","location":"Daejeon, Korea, Republic of","start":{"date-parts":[[2026,5,18]]},"end":{"date-parts":[[2026,5,22]]}},"container-title":["2026 IEEE International Conference on Software Testing, Verification and Validation (ICST)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11600401\/11600462\/11600463.pdf?arnumber=11600463","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,7,17]],"date-time":"2026-07-17T05:49:19Z","timestamp":1784267359000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11600463\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,5,18]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/icst69053.2026.00066","relation":{},"subject":[],"published":{"date-parts":[[2026,5,18]]}}}