{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,17]],"date-time":"2026-07-17T15:48:30Z","timestamp":1784303310148,"version":"3.55.0"},"reference-count":27,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,5,18]],"date-time":"2026-05-18T00:00:00Z","timestamp":1779062400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,5,18]],"date-time":"2026-05-18T00:00:00Z","timestamp":1779062400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,5,18]]},"DOI":"10.1109\/icst69053.2026.00069","type":"proceedings-article","created":{"date-parts":[[2026,7,16]],"date-time":"2026-07-16T21:48:20Z","timestamp":1784238500000},"page":"503-506","source":"Crossref","is-referenced-by-count":3,"title":["ICST Tool Competition 2026 - SDC Testing Track"],"prefix":"10.1109","author":[{"given":"Prakash","family":"Aryan","sequence":"first","affiliation":[{"name":"University of Bern,Bern,Switzerland"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Christian","family":"Birchler","sequence":"additional","affiliation":[{"name":"University of Bern,Bern,Switzerland"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tommaso","family":"Fulcini","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Turin,Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Luigi Libero","family":"Lucio","sequence":"additional","affiliation":[{"name":"Università di Napoli Federico II,Naples,Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sebastiano","family":"Panichella","sequence":"additional","affiliation":[{"name":"University of Bern & AI4I-The Italian Institute of Artificial Intelligence for Industry,Bern,Switzerland"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-025-10697-z"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-95-1786-2_6"},{"key":"ref3","article-title":"Roadmap for DevOps in Cyber-Physical Systems, ser. Communications of Shonan Meetings","volume-title":"Springer","author":"Panichella"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/3711906"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2022.111425"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"108123","DOI":"10.1016\/j.infsof.2026.108123","article-title":"The role of road features and vehicle dynamics in cost-effective autonomous vehicles safety testing: Insights from instance space analysis","volume":"195","author":"Crespo-Rodriguez","year":"2026","journal-title":"Information and Software Technology"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/3643991.3644891"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/icst57152.2023.00034"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2026.114379"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/3639478.3640031"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ASE63991.2025.00277"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/3786155.3795699"},{"issue":"2","key":"ref13","doi-asserted-by":"crossref","first-page":"67","DOI":"10.1002\/stv.430","article-title":"Regression testing minimization, selection and prioritization: a survey","volume":"22","author":"Yoo","year":"2012","journal-title":"Softw. Test. Verification Reliab."},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICST69053.2026.00072"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICST69053.2026.00071"},{"key":"ref16","article-title":"EagleSemble at the ICST 2026 Tool Competition - self-driving car testing track","volume-title":"2026 IEEE Conference on Software Testing, Verification and Validation (ICST)","author":"Aquilino"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICST69053.2026.00070"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/3786155.3795698"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/3533818"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-023-10286-y"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.scico.2023.102926"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/SANER53432.2022.00030"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/3526072.3527531"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/sbst52555.2021.00016"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/3526072.3527532"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1002\/smr.2653"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/3643768"}],"event":{"name":"2026 IEEE International Conference on Software Testing, Verification and Validation (ICST)","location":"Daejeon, Korea, Republic of","start":{"date-parts":[[2026,5,18]]},"end":{"date-parts":[[2026,5,22]]}},"container-title":["2026 IEEE International Conference on Software Testing, Verification and Validation (ICST)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11600401\/11600462\/11600556.pdf?arnumber=11600556","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,7,17]],"date-time":"2026-07-17T05:35:54Z","timestamp":1784266554000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11600556\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,5,18]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/icst69053.2026.00069","relation":{},"subject":[],"published":{"date-parts":[[2026,5,18]]}}}