{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T01:27:13Z","timestamp":1729646833845,"version":"3.28.0"},"reference-count":25,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/icstw.2015.7107460","type":"proceedings-article","created":{"date-parts":[[2015,5,14]],"date-time":"2015-05-14T16:37:48Z","timestamp":1431621468000},"page":"1-8","source":"Crossref","is-referenced-by-count":7,"title":["A novel simulation approach for fault injection resistance evaluation on smart cards"],"prefix":"10.1109","author":[{"given":"Lionel","family":"Riviere","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Julien","family":"Bringer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Thanh-Ha","family":"Le","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Herve","family":"Chabanne","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.4218\/etrij.11.0110.0478"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2012.6224334"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2008.20"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2001.941394"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/6.780999"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/WIFS.2011.6123124"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2010.62"},{"key":"ref17","first-page":"937","article-title":"FPGA Modeling of Fault-Injection Attacks on Cryptographic Devices","volume":"3","author":"kosuri","year":"2013","journal-title":"IJERA"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ARES.2012.79"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2014.34"},{"key":"ref4","first-page":"17","article-title":"Electromagnetic Glitch on the AES Round Counter","author":"dehbaoui","year":"2013","journal-title":"COSADE"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s00145-010-9083-9"},{"key":"ref6","first-page":"16","article-title":"Experimenting with Faults, Lattices and the DSA","author":"naccache","year":"2005","journal-title":"Public Key Cryptography vol 3386 of LNCS"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2010.18"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5456933"},{"key":"ref7","first-page":"115","article-title":"Breaking Public Key Cryptosystems on Tamper Resistant Devices in the Presence of Transient Faults","author":"bao","year":"1997","journal-title":"Security Protocols Workshop vol 1361 of LNCS"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DTIS.2011.5941421"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"162","DOI":"10.1007\/978-3-540-45126-6_12","article-title":"Fault Based Cryptanalysis of the Advanced Encryption Standard (AES)","author":"bl\u00f6mer","year":"2003","journal-title":"Financial Cryptography"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2012.2188769"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/12.364536"},{"journal-title":"Identification Cards - Integrated Circuit Cards - Part 4 Organization Security and Commands for Interchange","year":"2013","key":"ref22"},{"key":"ref21","first-page":"222","article-title":"Idea: Embedded Fault Injection Simulator on Smartcard","author":"berthier","year":"2014","journal-title":"ESSoS"},{"key":"ref24","first-page":"2","article-title":"Optical Fault Induction Attacks","author":"skorobogatov","year":"2002","journal-title":"CHES"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-11212-1_12"},{"key":"ref25","first-page":"388","article-title":"Differential power analysis","author":"kocher","year":"1999","journal-title":"Crypto"}],"event":{"name":"2015 IEEE Eighth International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","start":{"date-parts":[[2015,4,13]]},"location":"Graz, Austria","end":{"date-parts":[[2015,4,17]]}},"container-title":["2015 IEEE Eighth International Conference on Software Testing, Verification and Validation Workshops (ICSTW)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7100633\/7107396\/07107460.pdf?arnumber=7107460","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,23]],"date-time":"2017-06-23T07:38:45Z","timestamp":1498203525000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7107460\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/icstw.2015.7107460","relation":{},"subject":[],"published":{"date-parts":[[2015,4]]}}}