{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,2]],"date-time":"2024-09-02T10:31:45Z","timestamp":1725273105042},"reference-count":33,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/icstw.2015.7107478","type":"proceedings-article","created":{"date-parts":[[2015,5,14]],"date-time":"2015-05-14T20:37:48Z","timestamp":1431635868000},"source":"Crossref","is-referenced-by-count":2,"title":["Supporting software product line testing by optimizing code configuration coverage"],"prefix":"10.1109","author":[{"given":"Laszlo","family":"Vidacs","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ferenc","family":"Horvath","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jozsef","family":"Mihalicza","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bela","family":"Vancsics","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Arpad","family":"Beszedes","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.scico.2009.02.003"},{"key":"ref32","first-page":"230","article-title":"Macro impact analysis using macro slicing","author":"vid\u00e1cs","year":"2007","journal-title":"Proc 2nd Intern Conf on Software and Data Technologies ICSOFT'2007"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/CSMR.2004.1281408"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1145\/2580950"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2014.2327020"},{"key":"ref11","year":"2015"},{"key":"ref12","doi-asserted-by":"crossref","first-page":"638","DOI":"10.1007\/978-3-642-24485-8_47","article-title":"Properties of realistic feature models make combinatorial testing of product lines feasible","author":"johansen","year":"2011","journal-title":"Proceedings of the 14th International Conference on Model Driven Engineering Languages and Systems MODELS'11"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/2362536.2362547"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2013.45"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/1868688.1868693"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.1994.296765"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CSMR.2003.1192425"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/1806799.1806819"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/PLEASE.2012.6229772"},{"key":"ref28","year":"2015"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/WCRE.2001.957833"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/CSMR.2000.827299"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"7","DOI":"10.1007\/11554844_3","article-title":"Feature models, grammars, and propositional formulas","author":"batory","year":"2005","journal-title":"Software Product Lines"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-09156-3_29"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1145\/2094091.2094095"},{"key":"ref5","author":"clements","year":"2001","journal-title":"Software Product Lines Practices and Patterns"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-012-9208-x"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2010.05.011"},{"key":"ref2","first-page":"180","article-title":"Pairwise testing - a best practice that isn't","author":"bach","year":"2004","journal-title":"Proceedings of the 22nd Pacific Northwest Software Quality Conference"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/2648511.2648513"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/1509239.1509274"},{"key":"ref20","doi-asserted-by":"crossref","first-page":"136","DOI":"10.1007\/978-3-642-15579-6_10","article-title":"Evolution of the linux kernel variability model","author":"lotufo","year":"2010","journal-title":"Software Product Lines Going beyond"},{"key":"ref22","doi-asserted-by":"crossref","first-page":"196","DOI":"10.1007\/978-3-642-15579-6_14","article-title":"Automated incremental pairwise testing of software product lines","author":"oster","year":"2010","journal-title":"Proceedings of the 14th International Conference on Software Product Lines Going Beyond SPLC'10"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2010.12.003"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-28901-1"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2010.43"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/1233901.1233910"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/B978-0-12-396535-6.00007-7"}],"event":{"name":"2015 IEEE Eighth International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","location":"Graz, Austria","start":{"date-parts":[[2015,4,13]]},"end":{"date-parts":[[2015,4,17]]}},"container-title":["2015 IEEE Eighth International Conference on Software Testing, Verification and Validation Workshops (ICSTW)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7100633\/7107396\/07107478.pdf?arnumber=7107478","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,23]],"date-time":"2017-06-23T11:38:45Z","timestamp":1498217925000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7107478\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":33,"URL":"https:\/\/doi.org\/10.1109\/icstw.2015.7107478","relation":{},"subject":[],"published":{"date-parts":[[2015,4]]}}}