{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,3]],"date-time":"2026-09-03T06:21:39Z","timestamp":1788416499437,"version":"build-2803163510"},"reference-count":26,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,5,18]],"date-time":"2026-05-18T00:00:00Z","timestamp":1779062400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,5,18]],"date-time":"2026-05-18T00:00:00Z","timestamp":1779062400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,5,18]]},"DOI":"10.1109\/icstw72326.2026.00039","type":"proceedings-article","created":{"date-parts":[[2026,7,16]],"date-time":"2026-07-16T21:47:20Z","timestamp":1784238440000},"page":"159-162","source":"Crossref","is-referenced-by-count":1,"title":["Test Design and Review Argumentation in AI-Assisted Test Generation"],"prefix":"10.1109","author":[{"given":"Eduard Paul","family":"Enoiu","sequence":"first","affiliation":[{"name":"Mälardalen University,Department of Computer Science and Engineering,Västerås,Sweden"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Robert","family":"Feldt","sequence":"additional","affiliation":[{"name":"Chalmers University of Technology University of Gothenburg,Gothenburg,Sweden"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2024.3428972"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-95-0011-6_10"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/3696630.3728544"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/3793654.3793754"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/s43681-025-00804-7"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.6028\/nist.ir.8312"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1038\/s42256-019-0088-2"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1017\/9781316771273"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/SEAA.2008.28"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ieeestd.1989.82361"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICSTW.2011.58"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2006.08.040"},{"key":"ref13","article-title":"Iso\/iec\/ieee 29119-1:2013(e): Software and systems engineering software testing part 1:concepts and [elektronisk resurs]","year":"2013"},{"key":"ref14","volume-title":"Software testing foundations: A study guide for the certified tester exam-foundation level-ISTQB\u00ae compliant","author":"Spillner","year":"2021"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-64218-5_44"},{"key":"ref16","article-title":"50128: Railway Application\u2013Communications, Signaling and Processing Systems\u2013Software for Railway Control and Protection Systems","year":"2001","journal-title":"Standard Report"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4471-2312-5"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ESEM.2009.5314240"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/QRS-C51114.2020.00053"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-77583-6"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.2307\/358777"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-43240-8_10"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2012.55"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE-FoSE59343.2023.00008"},{"key":"ref25","article-title":"Legal Interpretation","volume-title":"The Stanford Encyclopedia of Philosophy","author":"Greenberg","year":"2021"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-33666-9_30"}],"event":{"name":"2026 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","location":"Daejeon, Korea, Republic of","start":{"date-parts":[[2026,5,18]]},"end":{"date-parts":[[2026,5,22]]}},"container-title":["2026 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11600400\/11600402\/11600451.pdf?arnumber=11600451","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,7,17]],"date-time":"2026-07-17T05:34:18Z","timestamp":1784266458000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11600451\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,5,18]]},"references-count":26,"URL":"https:\/\/doi.org\/10.1109\/icstw72326.2026.00039","relation":{},"subject":[],"published":{"date-parts":[[2026,5,18]]}}}