{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:14:55Z","timestamp":1740100495810,"version":"3.37.3"},"reference-count":6,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,11,24]],"date-time":"2021-11-24T00:00:00Z","timestamp":1637712000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,11,24]],"date-time":"2021-11-24T00:00:00Z","timestamp":1637712000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,11,24]],"date-time":"2021-11-24T00:00:00Z","timestamp":1637712000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,11,24]]},"DOI":"10.1109\/icta53157.2021.9661623","type":"proceedings-article","created":{"date-parts":[[2022,1,3]],"date-time":"2022-01-03T20:19:29Z","timestamp":1641241169000},"page":"99-100","source":"Crossref","is-referenced-by-count":1,"title":["A New Method to Extract Mobility Degradation and Parasitic Series Resistance of Nano-scaled MOSFETs"],"prefix":"10.1109","author":[{"given":"Zixuan","family":"Yang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Qian","family":"Xie","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Qiao","family":"He","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Meng","family":"Zhao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zheng","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2015.11.007"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2016.2538778"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2002.802679"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/16.817582"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/EDL.1980.25276"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1143\/JJAP.18.953"}],"event":{"name":"2021 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)","start":{"date-parts":[[2021,11,24]]},"location":"Zhuhai, China","end":{"date-parts":[[2021,11,26]]}},"container-title":["2021 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9661584\/9661598\/09661623.pdf?arnumber=9661623","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T16:56:43Z","timestamp":1652201803000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9661623\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,11,24]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/icta53157.2021.9661623","relation":{},"subject":[],"published":{"date-parts":[[2021,11,24]]}}}