{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,20]],"date-time":"2026-01-20T15:29:18Z","timestamp":1768922958228,"version":"3.49.0"},"reference-count":5,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,10,27]],"date-time":"2023-10-27T00:00:00Z","timestamp":1698364800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,27]],"date-time":"2023-10-27T00:00:00Z","timestamp":1698364800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62204034,62174029"],"award-info":[{"award-number":["62204034,62174029"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2022TQ0061,2022M720710"],"award-info":[{"award-number":["2022TQ0061,2022M720710"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,10,27]]},"DOI":"10.1109\/icta60488.2023.10364332","type":"proceedings-article","created":{"date-parts":[[2023,12,28]],"date-time":"2023-12-28T19:21:00Z","timestamp":1703791260000},"page":"13-14","source":"Crossref","is-referenced-by-count":2,"title":["Superior Performances of Dynamic On-State Resistance in 1.9kV GaN-on-Sapphire HEMT"],"prefix":"10.1109","author":[{"given":"Weihao","family":"Lu","sequence":"first","affiliation":[{"name":"Southeast University,National ASIC System Engineering Research Center"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sheng","family":"Li","sequence":"additional","affiliation":[{"name":"Southeast University,National ASIC System Engineering Research Center"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Siyang","family":"Liu","sequence":"additional","affiliation":[{"name":"Southeast University,National ASIC System Engineering Research Center"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yanfeng","family":"Ma","sequence":"additional","affiliation":[{"name":"Southeast University,National ASIC System Engineering Research Center"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Long","family":"Zhang","sequence":"additional","affiliation":[{"name":"Southeast University,National ASIC System Engineering Research Center"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jiaxing","family":"Wei","sequence":"additional","affiliation":[{"name":"Southeast University,National ASIC System Engineering Research Center"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Weifeng","family":"Sun","sequence":"additional","affiliation":[{"name":"Southeast University,National ASIC System Engineering Research Center"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yiheng","family":"Li","sequence":"additional","affiliation":[{"name":"CorEnergy Semiconductor Technology Co. Ltd"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yuanyang","family":"Xia","sequence":"additional","affiliation":[{"name":"CorEnergy Semiconductor Technology Co. Ltd"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ke","family":"Wang","sequence":"additional","affiliation":[{"name":"CorEnergy Semiconductor Technology Co. Ltd"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tinggang","family":"Zhu","sequence":"additional","affiliation":[{"name":"CorEnergy Semiconductor Technology Co. Ltd"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tte.2019.2892807"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/iedm.2017.8268357"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/led.2017.2670925"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2019.2933362"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2022.3151558"}],"event":{"name":"2023 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)","location":"Hefei, China","start":{"date-parts":[[2023,10,27]]},"end":{"date-parts":[[2023,10,29]]}},"container-title":["2023 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10363774\/10363775\/10364332.pdf?arnumber=10364332","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,12]],"date-time":"2024-01-12T20:39:55Z","timestamp":1705091995000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10364332\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,27]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/icta60488.2023.10364332","relation":{},"subject":[],"published":{"date-parts":[[2023,10,27]]}}}