{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,17]],"date-time":"2025-04-17T04:15:01Z","timestamp":1744863301350,"version":"3.40.4"},"reference-count":5,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,10,25]],"date-time":"2024-10-25T00:00:00Z","timestamp":1729814400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,10,25]],"date-time":"2024-10-25T00:00:00Z","timestamp":1729814400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100010909","name":"Young Scientists Fund","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100010909","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012429","name":"Central Universities in China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100012429","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,10,25]]},"DOI":"10.1109\/icta64028.2024.10860406","type":"proceedings-article","created":{"date-parts":[[2025,2,6]],"date-time":"2025-02-06T18:34:22Z","timestamp":1738866862000},"page":"210-211","source":"Crossref","is-referenced-by-count":0,"title":["A Wideband Miniaturized dB-Linear Millimeter-Wave Power Detector in 40-nm CMOS"],"prefix":"10.1109","author":[{"given":"Yun","family":"Wang","sequence":"first","affiliation":[{"name":"Fudan University,State Key Laboratory of Integrated Chips and Systems, School of Microelectronics,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Songlei","family":"Meng","sequence":"additional","affiliation":[{"name":"Fudan University,State Key Laboratory of Integrated Chips and Systems, School of Microelectronics,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shiping","family":"Zheng","sequence":"additional","affiliation":[{"name":"Fudan University,State Key Laboratory of Integrated Chips and Systems, School of Microelectronics,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hongtao","family":"Xu","sequence":"additional","affiliation":[{"name":"Fudan University,State Key Laboratory of Integrated Chips and Systems, School of Microelectronics,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/SIECPC.2011.5876966"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/A-SSCC53895.2021.9634830"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2015.2496220"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2008.921299"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2017.8058975"}],"event":{"name":"2024 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)","start":{"date-parts":[[2024,10,25]]},"location":"Hangzhou, China","end":{"date-parts":[[2024,10,27]]}},"container-title":["2024 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10860283\/10860285\/10860406.pdf?arnumber=10860406","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,4,16]],"date-time":"2025-04-16T17:45:13Z","timestamp":1744825513000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10860406\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,10,25]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/icta64028.2024.10860406","relation":{},"subject":[],"published":{"date-parts":[[2024,10,25]]}}}