{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T17:30:10Z","timestamp":1725471010605},"reference-count":4,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,10]]},"DOI":"10.1109\/ictc.2018.8539639","type":"proceedings-article","created":{"date-parts":[[2018,12,7]],"date-time":"2018-12-07T22:51:33Z","timestamp":1544223093000},"page":"1267-1269","source":"Crossref","is-referenced-by-count":1,"title":["High-Speed Signal Integrity Design for HDCA Systems"],"prefix":"10.1109","author":[{"given":"Wonok","family":"Kwon","sequence":"first","affiliation":[]},{"given":"Young Woo","family":"Kim","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"STDR-65 Time-Domain Reflectometer Manual","year":"0","key":"ref4"},{"journal-title":"OrCAD Sigrity ERC Manual","year":"0","key":"ref3"},{"key":"ref2","article-title":"Design and simulation of a PCI express gene communication channel","author":"warnakulasuriyarachchi","year":"2010","journal-title":"Massachusetts Institute of Technology"},{"journal-title":"PCI Express 3 0 characterization compliance and debug for signal integrity engineers","year":"2013","author":"li","key":"ref1"}],"event":{"name":"2018 International Conference on Information and Communication Technology Convergence (ICTC)","start":{"date-parts":[[2018,10,17]]},"location":"Jeju","end":{"date-parts":[[2018,10,19]]}},"container-title":["2018 International Conference on Information and Communication Technology Convergence (ICTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8509497\/8539346\/08539639.pdf?arnumber=8539639","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,23]],"date-time":"2020-08-23T23:34:11Z","timestamp":1598225651000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8539639\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,10]]},"references-count":4,"URL":"https:\/\/doi.org\/10.1109\/ictc.2018.8539639","relation":{},"subject":[],"published":{"date-parts":[[2018,10]]}}}