{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T03:52:14Z","timestamp":1730260334991,"version":"3.28.0"},"reference-count":13,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/icvd.2003.1183126","type":"proceedings-article","created":{"date-parts":[[2003,8,27]],"date-time":"2003-08-27T11:38:00Z","timestamp":1061984280000},"page":"128-133","source":"Crossref","is-referenced-by-count":2,"title":["Application of look-up table approach to high-K gate dielectric MOS transistor circuits"],"prefix":"10.1109","author":[{"given":"D.V.","family":"Kumar","sequence":"first","affiliation":[]},{"given":"N.R.","family":"Mohapatra","sequence":"additional","affiliation":[]},{"given":"M.B.","family":"Patil","sequence":"additional","affiliation":[]},{"given":"V.R.","family":"Rao","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/16.772508"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ESSDERC.2001.195245"},{"journal-title":"MEDICI Users' Manual Version 4 0","year":"0","key":"ref12"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/16.998591"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1063\/1.1361065"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/43.29592"},{"journal-title":"ISE TCAD Manual","first-page":"6","year":"2000","key":"ref6"},{"article-title":"Operation and Modeling of The MOS Transistor","year":"1999","author":"tsividis","key":"ref5"},{"key":"ref8","first-page":"206","article-title":"Quantum-mechanical modeling of electron tunneling current from the inversion layer of ultra-thin oxide MOS-FETs","volume":"18","author":"lo","year":"1997","journal-title":"IEEEE Lectron Device Letters"},{"article-title":"SEQUEL Users' Manual","year":"0","author":"patil","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1982.1051758"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/31.52727"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2000.852781"}],"event":{"name":"16th International Conference on VLSI Design. Concurrently with the 2nd International Conference on Embedded Systems Design","acronym":"ICVD-03","location":"New Delhi, India"},"container-title":["16th International Conference on VLSI Design, 2003. Proceedings."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8427\/26547\/01183126.pdf?arnumber=1183126","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T20:04:04Z","timestamp":1489435444000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1183126\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/icvd.2003.1183126","relation":{},"subject":[]}}