{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T11:45:28Z","timestamp":1725450328790},"reference-count":12,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/icvd.2003.1183162","type":"proceedings-article","created":{"date-parts":[[2003,8,27]],"date-time":"2003-08-27T11:38:00Z","timestamp":1061984280000},"page":"353-360","source":"Crossref","is-referenced-by-count":3,"title":["New graphical I\/sub DDQ\/ signatures reduce defect level and yield loss"],"prefix":"10.1109","author":[{"given":"L.","family":"Rao","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.L.","family":"Bushnell","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"V.D.","family":"Agrawal","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","first-page":"242","article-title":"Burn-in Elimination of a High Volume Microprocessor Using IDDQ","author":"henry","year":"1996","journal-title":"Proc of the Int'l Test Conf"},{"key":"ref3","first-page":"25","article-title":"Current Signatures for Production Testing","author":"gattiker","year":"1996","journal-title":"IEEE Int l Workshop IDDQTesting"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/54.914627"},{"key":"ref6","first-page":"217","article-title":"CMOS is Most Testable","author":"levi","year":"1981","journal-title":"Proc of the Int'l Test Conf"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639638"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"101","DOI":"10.1109\/TEST.2001.966623","article-title":"The Future of Delta IDDQ Testing","author":"kruseman","year":"2001","journal-title":"Proc of the Int'l Test Conf"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1997.599445"},{"key":"ref8","first-page":"738","article-title":"Current Ratios: A Self-Scaling Technique for Production IDDQ Testing","author":"maxwell","year":"1999","journal-title":"Proc of the Int'l Test Conf"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IDDQ.1998.730730"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1996.510844"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1997.600334"},{"journal-title":"Introduction to IDDQTesting","year":"1997","author":"chakravarty","key":"ref1"}],"event":{"name":"16th International Conference on VLSI Design. Concurrently with the 2nd International Conference on Embedded Systems Design","acronym":"ICVD-03","location":"New Delhi, India"},"container-title":["16th International Conference on VLSI Design, 2003. Proceedings."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8427\/26547\/01183162.pdf?arnumber=1183162","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,15]],"date-time":"2017-06-15T20:08:58Z","timestamp":1497557338000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1183162\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/icvd.2003.1183162","relation":{},"subject":[]}}