{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T09:16:24Z","timestamp":1729674984614,"version":"3.28.0"},"reference-count":33,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/icvd.2004.1260982","type":"proceedings-article","created":{"date-parts":[[2004,6,21]],"date-time":"2004-06-21T17:52:40Z","timestamp":1087840360000},"page":"585-590","source":"Crossref","is-referenced-by-count":5,"title":["Can SAT be used to improve sequential ATPG methods?"],"prefix":"10.1109","author":[{"given":"M.R.","family":"Prasad","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.S.","family":"Hsiao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Jain","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref33","first-page":"272","article-title":"SATO: An Efficient Propositional Prover","author":"zhang","year":"1997","journal-title":"Proc of CADE"},{"key":"ref32","first-page":"87","article-title":"Conflict Driven Techniques for Improving Deterministic Test Pattern Generation","author":"wang","year":"2002","journal-title":"Proc of ICCAD"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/43.536723"},{"key":"ref30","article-title":"Pruning Techniques for the SAT-based Bounded Model Checking Problem","author":"shtrichman","year":"2001","journal-title":"Proc of CHARME"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/EDTC.1996.494327"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/EDTC.1997.582325"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843854"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1993.313303"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1997.597155"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/43.108614"},{"key":"ref16","first-page":"147","article-title":"Techniques for Improving the Efficiency of Sequential Circuit Test Generation","author":"lin","year":"1999","journal-title":"Proc of ICCAD"},{"key":"ref17","article-title":"A Circuit SAT Solver with Signal Correlation Guided Learning","author":"lu","year":"2003","journal-title":"Proc of the Design Automation & Test in Europe"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/12.769433"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2001.156196"},{"key":"ref28","first-page":"813","article-title":"Effective Static Property Checking Using Simulation-Based ATPG","author":"sheng","year":"2002","journal-title":"Proc 39th DAC"},{"key":"ref4","first-page":"193","article-title":"Symbolic Model Checking without BDDs","author":"biere","year":"1999","journal-title":"TACAS"},{"key":"ref27","first-page":"108","article-title":"Checking safety properties using induction and a SAT-solver","volume":"1954","author":"sheeran","year":"2000","journal-title":"Proc of FMCAD"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/43.406717"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"747","DOI":"10.1109\/DAC.2002.1012722","article-title":"Combining strengths of circuit-based and CNF-based algorithms for a high-performance SAT solver","author":"ganai","year":"2002","journal-title":"Proc of 39th Design Automation Conference"},{"key":"ref29","first-page":"480","article-title":"Tuning SAT Checkers for Bounded Model Checking","author":"shtrichman","year":"2000","journal-title":"Proc of CAV"},{"key":"ref5","first-page":"418","article-title":"Model Checking Based on Sequential ATPG","author":"boppana","year":"1999","journal-title":"Proc of CAV"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"1080","DOI":"10.1109\/TCAD.2003.814953","article-title":"PROPTEST: A Property-Based Test Generator for Synchronous Sequential Circuits","volume":"22","author":"guo","year":"2003","journal-title":"IEEE Trans on CAD"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2002.998262"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041761"},{"key":"ref9","first-page":"120","article-title":"Smart Simulation Using Collaborative Formal and Simulation Engines","author":"ho","year":"2000","journal-title":"Proc of ICCAD"},{"key":"ref1","first-page":"411","article-title":"Symbolic Reachability Analysis Based on SAT-Solvers","author":"abdulla","year":"2000","journal-title":"TACAS"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/43.806801"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/HLDVT.2001.972826"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/EDAC.1991.206393"},{"key":"ref24","article-title":"New Procedures for Identifying Undetectable and Redundant Faults In Synchronous Seauential Circuits","author":"reddy","year":"1999","journal-title":"Proc of VTS"},{"key":"ref23","first-page":"114","article-title":"Using SAT for Combinational Equivalence Checking","author":"prasad","year":"2001","journal-title":"Proc of DATE"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.2003.1183144"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/217474.217527"}],"event":{"name":". 17th International Conference on VLSI Design","acronym":"ICVD-04","location":"Mumbai, India"},"container-title":["17th International Conference on VLSI Design. Proceedings."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8911\/28180\/01260982.pdf?arnumber=1260982","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T04:12:10Z","timestamp":1497586330000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1260982\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":33,"URL":"https:\/\/doi.org\/10.1109\/icvd.2004.1260982","relation":{},"subject":[]}}