{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,27]],"date-time":"2025-03-27T12:34:00Z","timestamp":1743078840187},"reference-count":15,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/icvd.2004.1260984","type":"proceedings-article","created":{"date-parts":[[2004,6,21]],"date-time":"2004-06-21T17:52:40Z","timestamp":1087840360000},"page":"597-602","source":"Crossref","is-referenced-by-count":17,"title":["Fast, layout-aware validation of test-vectors for nanometer-related timing failures"],"prefix":"10.1109","author":[{"given":"A.","family":"Kokrady","sequence":"first","affiliation":[]},{"given":"C.P.","family":"Ravikumar","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/266021.266176"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/43.298037"},{"journal-title":"Synopsys Prime Time User's Manual","year":"2002","key":"ref12"},{"journal-title":"Synopsys Power Compiler User's Manual","year":"2002","key":"ref13"},{"journal-title":"Synopsys Inc AstroRail User manual","year":"2002","key":"ref14"},{"journal-title":"Internal document","article-title":"Texas Instruments. Toggle Frequency Calculator Reference Manual","year":"2002","key":"ref15"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2000.855296"},{"article-title":"Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits","year":"2000","author":"bushnell","key":"ref3"},{"key":"ref6","article-title":"Automatic Sizing of Power and Ground Networks in VLSI","author":"dutta","year":"1989","journal-title":"IEEE Proc 26th DAC"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/43.703825"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"384","DOI":"10.1145\/157485.164941","article-title":"resolving signal correlations for estimating maximum currents in cmos combinational circuits","author":"kriplani","year":"1993","journal-title":"30th ACM\/IEEE Design Automation Conference"},{"key":"ref7","article-title":"Power estimation tool for sub-micron VLSI circuits","author":"haroun","year":"1992","journal-title":"IEEE Int Conf on Computer Aided Design"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/12.372035"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2000.838881"},{"key":"ref9","first-page":"402","article-title":"Worst Case Voltage Drop in Power and Ground Busses in CMOS VLSI Circuits","author":"kriplani","year":"1993","journal-title":"SRC TECHON'93 Conference"}],"event":{"name":". 17th International Conference on VLSI Design","acronym":"ICVD-04","location":"Mumbai, India"},"container-title":["17th International Conference on VLSI Design. Proceedings."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8911\/28180\/01260984.pdf?arnumber=1260984","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T04:12:10Z","timestamp":1497586330000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1260984\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/icvd.2004.1260984","relation":{},"subject":[]}}