{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T08:17:08Z","timestamp":1725524228633},"reference-count":12,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/icvd.2004.1261019","type":"proceedings-article","created":{"date-parts":[[2004,6,21]],"date-time":"2004-06-21T21:52:40Z","timestamp":1087854760000},"page":"753-756","source":"Crossref","is-referenced-by-count":5,"title":["Built-in self-test technique for selective detection of neighbourhood pattern sensitive faults in memories"],"prefix":"10.1109","author":[{"given":"R.S.","family":"Sable","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.P.","family":"Saraf","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.A.","family":"Parekhji","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.N.","family":"Chandorkar","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MTDT.1998.705948"},{"journal-title":"A Designer's Guide to Built-In Self-Test","year":"2002","author":"stroud","key":"ref3"},{"journal-title":"An Architecture for Programmable Memory BIST","year":"2002","author":"saraf","key":"ref10"},{"key":"ref6","first-page":"225","article-title":"Efficient Neighbourhood Pattern Sensitive Fault Test Algorithms for Semiconductor Memories","author":"cheng","year":"2001","journal-title":"Proc VLSI Test Symposium"},{"journal-title":"Memory Testing BIST and Iddq Test Techniques","year":"2003","author":"sable","key":"ref11"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/43.55188"},{"key":"ref12","article-title":"Built-in Self-test Technique for Selective Detection of Neighbourhood Pattern Sensitive Faults in Memories","author":"sable","year":"2003","journal-title":"Internal Communication"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/43.536714"},{"key":"ref7","first-page":"1072","article-title":"An Efficient Built-in Self Test for RAMs","author":"mazumder","year":"1987","journal-title":"Proc Intl Test Conference"},{"journal-title":"Built-In Test for VLSI Pseudorandom Techniques","year":"1987","author":"bardell","key":"ref2"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/12.24267"},{"key":"ref1","article-title":"Testing of Semiconductor Memories: Theory and Practice","author":"van de goor","year":"1999","journal-title":"ComTex Publishing"}],"event":{"name":". 17th International Conference on VLSI Design","acronym":"ICVD-04","location":"Mumbai, India"},"container-title":["17th International Conference on VLSI Design. Proceedings."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8911\/28180\/01261019.pdf?arnumber=1261019","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T23:09:02Z","timestamp":1489446542000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1261019\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/icvd.2004.1261019","relation":{},"subject":[]}}