{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T20:59:17Z","timestamp":1729630757744,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE Computer Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/icvd.2005.83","type":"proceedings-article","created":{"date-parts":[[2005,4,12]],"date-time":"2005-04-12T10:25:04Z","timestamp":1113301504000},"page":"471-478","source":"Crossref","is-referenced-by-count":12,"title":["Distance Restricted Scan Chain Reordering to Enhance Delay Fault Coverage"],"prefix":"10.1109","author":[{"family":"Wei Li","sequence":"first","affiliation":[]},{"family":"Seongmoon Wang","sequence":"additional","affiliation":[]},{"given":"S.T.","family":"Chakradhar","sequence":"additional","affiliation":[]},{"given":"S.M.","family":"Reddy","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"crossref","first-page":"671","DOI":"10.1126\/science.220.4598.671","article-title":"Optimization by simulated annealing","volume":"220","author":"kirkpatrik","year":"1983","journal-title":"Science"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/43.108614"},{"key":"18","doi-asserted-by":"crossref","first-page":"502","DOI":"10.1145\/37888.37963","article-title":"a topological search algorithm for atpg","author":"kirkland","year":"1987","journal-title":"24th ACM\/IEEE Design Automation Conference"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1988.122540"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/43.238038"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/43.275361"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/43.310903"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2004.1269074"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743173"},{"key":"3","first-page":"342","article-title":"Model for delay faults based upon paths","author":"smith","year":"1985","journal-title":"Proc ITC"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1988.207872"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.1987.295104"},{"key":"10","first-page":"574","article-title":"A scalable scan-path test point insertion technique to enhance delay fault coverage for standard scan designs","author":"wang","year":"2003","journal-title":"Proc ITC"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/43.238615"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1994.292299"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1991.519696"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.1987.1270315"},{"key":"9","first-page":"638","article-title":"Reducing correlation to improve coverage of delay faults in scan-path design","author":"mao","year":"1994","journal-title":"IEEE TCAD"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1992.527893"}],"event":{"name":"18th International Conference on VLSI Design","acronym":"ICVD-05","location":"Kolkata, India"},"container-title":["18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9501\/30140\/01383320.pdf?arnumber=1383320","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T14:14:14Z","timestamp":1497622454000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1383320\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/icvd.2005.83","relation":{},"subject":[]}}