{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,19]],"date-time":"2025-04-19T04:05:10Z","timestamp":1745035510508,"version":"3.40.4"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,12,27]],"date-time":"2024-12-27T00:00:00Z","timestamp":1735257600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,12,27]],"date-time":"2024-12-27T00:00:00Z","timestamp":1735257600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,12,27]]},"DOI":"10.1109\/icvisp64524.2024.10959695","type":"proceedings-article","created":{"date-parts":[[2025,4,17]],"date-time":"2025-04-17T17:37:52Z","timestamp":1744911472000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["PCB Surface Defect Detection Algorithm based on SC-YOLO"],"prefix":"10.1109","author":[{"given":"Shuo","family":"Wang","sequence":"first","affiliation":[{"name":"School of Electrical Engineering and Automation, Hefei University of Technology,Hefei,China"}]},{"given":"Yueteng","family":"Shen","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Hefei University of Technology,Hefei,China"}]},{"given":"Jianing","family":"Zheng","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Hefei University of Technology,Hefei,China"}]},{"given":"Yaowen","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Hefei University of Technology,Hefei,China"}]},{"given":"Yingying","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Hefei University of Technology,Hefei,China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.2139\/ssrn.4272620"},{"key":"ref2","first-page":"16","volume-title":"A low contrast defect detection method for PCB surface based on manual labeling; proceedings of the 2020 35th Youth Academic Annual Conference of Chinese Association of Automation (YAC)","author":"Luyang","year":"2020"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3390\/ma13245755"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2012.2205149"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/s10044-017-0640-9"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s11042-023-16218-8"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3153997"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3165287"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2764844"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2014.81"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/cvpr.2016.91"},{"key":"ref12","article-title":"SSD: Single Shot MultiBox Detector; proceedings of the Computer Vision - ECCV","volume-title":"2016, Cham, F 2016","author":"Liu","year":"2016"},{"key":"ref13","first-page":"17","volume-title":"SCConv: Spatial and Channel Reconstruction Convolution for Feature Redundancy; proceedings of the 2023 IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR)","author":"Li","year":"2023"},{"volume-title":"CARAFE: Content-Aware ReAssembly of FEatures; proceedings of the 2019 IEEE\/CVF International Conference on Computer Vision (ICCV)","year":"2019","author":"Wang","key":"ref14"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s11554-024-01436-6"}],"event":{"name":"2024 IEEE 8th International Conference on Vision, Image and Signal Processing (ICVISP)","start":{"date-parts":[[2024,12,27]]},"location":"Kunming, China","end":{"date-parts":[[2024,12,29]]}},"container-title":["2024 IEEE 8th International Conference on Vision, Image and Signal Processing (ICVISP)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10959324\/10959149\/10959695.pdf?arnumber=10959695","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,4,18]],"date-time":"2025-04-18T05:10:27Z","timestamp":1744953027000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10959695\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,12,27]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/icvisp64524.2024.10959695","relation":{},"subject":[],"published":{"date-parts":[[2024,12,27]]}}}