{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,14]],"date-time":"2026-01-14T18:02:32Z","timestamp":1768413752168,"version":"3.49.0"},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,9]]},"DOI":"10.1109\/idaacs.2013.6662642","type":"proceedings-article","created":{"date-parts":[[2013,11,27]],"date-time":"2013-11-27T16:53:59Z","timestamp":1385571239000},"page":"70-75","source":"Crossref","is-referenced-by-count":21,"title":["Approaches of voltage divider development for metrology verification of ADC"],"prefix":"10.1109","author":[{"given":"Roman","family":"Kochan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Orest","family":"Kochan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mykhaylo","family":"Chyrka","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Su Jun","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pavlo","family":"Bykovyy","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","year":"0","journal-title":"Measurement Analog to Digital Converters of Voltage and Current General Technical Requirements"},{"key":"2","year":"0","journal-title":"Measurement Analog to Digital Converters of Voltage and Current General Technical Requirements"},{"key":"10","first-page":"128","author":"mahnanov","year":"1970","journal-title":"Instrumentation of Frequency and Time-Pulse Conversion"},{"key":"1","year":"0","journal-title":"Law of Ukraine about Metrology and Metrology Activity"},{"key":"7","first-page":"1138","author":"kester","year":"2004","journal-title":"Analog-Digital Conversion"},{"key":"6","article-title":"Current problems of metrology reliability of industrial instrumentation","author":"mykyjchuk","year":"2009","journal-title":"Methods and Equipment for Quality Control - Ivano-Frankivsk"},{"key":"5","first-page":"224","article-title":"Information-energetic approach to quality coefficient evaluation of instrumentation","volume":"68","author":"yatsuk","year":"2008","journal-title":"Metrol Instrum"},{"key":"4","year":"0","journal-title":"Digital Measurement Devices and Converters of Voltage Current and Resistance General Technical Requirements and Testing Methods"},{"key":"9","year":"0","journal-title":"24-bit Sigma-delta Signal Conditioning ADC"},{"key":"8","year":"2000","journal-title":"IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters"},{"key":"11","author":"kochan","year":"0","journal-title":"Method of Analog to Digital Converters Verification on Operation Place"},{"key":"12","first-page":"252","author":"kochan","year":"2012","journal-title":"Precision Analog to Digital Converters with in System Verification Monograph"}],"event":{"name":"2013 IEEE 7th International Conference on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications (IDAACS)","location":"Berlin, Germany","start":{"date-parts":[[2013,9,12]]},"end":{"date-parts":[[2013,9,14]]}},"container-title":["2013 IEEE 7th International Conference on Intelligent Data Acquisition and Advanced Computing Systems (IDAACS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6653329\/6662618\/06662642.pdf?arnumber=6662642","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T21:09:19Z","timestamp":1490216959000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6662642\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,9]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/idaacs.2013.6662642","relation":{},"subject":[],"published":{"date-parts":[[2013,9]]}}}