{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T04:12:50Z","timestamp":1730261570285,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,9]]},"DOI":"10.1109\/idaacs.2015.7341407","type":"proceedings-article","created":{"date-parts":[[2015,12,3]],"date-time":"2015-12-03T16:11:35Z","timestamp":1449159095000},"page":"767-772","source":"Crossref","is-referenced-by-count":1,"title":["Integral nonlinearity correction of ADC using multi-resistors voltage divider"],"prefix":"10.1109","author":[{"given":"Jian-rong","family":"Li","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Roman","family":"Kochan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Orest","family":"Kochan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Halyna","family":"Klym","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Substitution Method For Measurement Of Medium Resistance","year":"0","key":"ref4"},{"journal-title":"24-Bit Sigma-Delta Signal Conditioning ADC with 2 Analog Input Channels – AD7714 Data Sheets","year":"0","key":"ref3"},{"key":"ref10","first-page":"553","author":"wang","year":"2011","journal-title":"Measurement of Data Modeling and Parameter Estimation"},{"journal-title":"IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters","year":"2000","key":"ref6"},{"key":"ref11","first-page":"952","author":"kester","year":"2004","journal-title":"The Data Conversion Handbook Analog Devices"},{"key":"ref5","first-page":"11","article-title":"ADC implementation for measurement using substitution method","author":"kochan","year":"2010","journal-title":"Ukrainian Journal of Metrology"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.csi.2005.01.015"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IDAACS.2013.6662642"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IDAACS.2011.6072708"},{"key":"ref2","first-page":"11","article-title":"Which ADC architecture is right for your application?","volume":"39","author":"kester","year":"2005","journal-title":"Analog Dialogue"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IDAACS.2007.4488363"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2003.1238355"}],"event":{"name":"2015 IEEE 8th International Conference on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications (IDAACS)","start":{"date-parts":[[2015,9,24]]},"location":"Warsaw, Poland","end":{"date-parts":[[2015,9,26]]}},"container-title":["2015 IEEE 8th International Conference on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications (IDAACS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7324044\/7341341\/07341407.pdf?arnumber=7341407","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T22:38:13Z","timestamp":1490395093000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7341407\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,9]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/idaacs.2015.7341407","relation":{},"subject":[],"published":{"date-parts":[[2015,9]]}}}