{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,5]],"date-time":"2026-04-05T20:41:33Z","timestamp":1775421693090,"version":"3.50.1"},"reference-count":30,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,9,7]],"date-time":"2023-09-07T00:00:00Z","timestamp":1694044800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,9,7]],"date-time":"2023-09-07T00:00:00Z","timestamp":1694044800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,9,7]]},"DOI":"10.1109\/idaacs58523.2023.10348713","type":"proceedings-article","created":{"date-parts":[[2023,12,21]],"date-time":"2023-12-21T19:20:33Z","timestamp":1703186433000},"page":"759-764","source":"Crossref","is-referenced-by-count":5,"title":["Enhancing Explainability in Plant Disease Classification using Score-CAM: Improving Early Diagnosis for Agricultural Productivity"],"prefix":"10.1109","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6729-1055","authenticated-orcid":false,"given":"Ramazan","family":"Kursun","sequence":"first","affiliation":[{"name":"Guneysinir Vocational School, Selcuk University,Konya,TÜRKİYE"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2737-2360","authenticated-orcid":false,"given":"Murat","family":"Koklu","sequence":"additional","affiliation":[{"name":"Selcuk University,Department of Computer Engineering,Konya,TÜRKİYE"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3390\/plants8110468"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/icaccs.2019.8728415"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.aiia.2021.05.002"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/access.2021.3069646"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/3371158.3371196"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2022.109287"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejrad.2023.110787"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/3474124.3474154"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-27486-3_17-1"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV48922.2021.00139"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/access.2020.3009852"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-35955-3_13"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.compag.2018.08.001"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.isprsjprs.2019.04.015"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s00217-023-04214-z"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s13369-020-04972-y"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/s00217-023-04319-5"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.compag.2020.105393"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/icbaie49996.2020.00012"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/icacsis.2018.8618169"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1155\/2017\/2917536"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.5120\/2183-2754"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.dib.2023.109185"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/s00217-022-04172-y"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/s00217-022-04059-y"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.jksuci.2022.06.007"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.3390\/electronics11071146"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/s00217-022-04080-1"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/CVPRW50498.2020.00020"},{"key":"ref30","article-title":"SS-CAM: Smoothed Score-CAM for sharper visual feature localization","author":"Wang","year":"2020","journal-title":"arXiv preprint"}],"event":{"name":"2023 IEEE 12th International Conference on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications (IDAACS)","location":"Dortmund, Germany","start":{"date-parts":[[2023,9,7]]},"end":{"date-parts":[[2023,9,9]]}},"container-title":["2023 IEEE 12th International Conference on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications (IDAACS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10348627\/10348628\/10348713.pdf?arnumber=10348713","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,12]],"date-time":"2024-01-12T02:58:56Z","timestamp":1705028336000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10348713\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,9,7]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/idaacs58523.2023.10348713","relation":{},"subject":[],"published":{"date-parts":[[2023,9,7]]}}}