{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T01:20:45Z","timestamp":1725412845694},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,12]]},"DOI":"10.1109\/idt.2011.6123092","type":"proceedings-article","created":{"date-parts":[[2012,1,11]],"date-time":"2012-01-11T17:00:45Z","timestamp":1326301245000},"page":"1-6","source":"Crossref","is-referenced-by-count":3,"title":["Process-variation and temperature aware soc test scheduling using particle swarm optimization"],"prefix":"10.1109","author":[{"given":"Nima","family":"Aghaee","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zebo","family":"Peng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Petru","family":"Eles","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2008.79"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2009.15"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.850860"},{"key":"ref6","article-title":"Thermal-aware test scheduling using on-chip temperature sensors","author":"yao","year":"0","journal-title":"VLSI Design"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2010.74"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s11721-007-0002-0"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2011.29"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681552"},{"key":"ref9","first-page":"878","article-title":"Compact thermal modeling for temperature-aware design","author":"wei huang","year":"2004","journal-title":"Proceedings 41st Design Automation Conference 2004 DAC"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2000.855293"}],"event":{"name":"2011 IEEE 6th International Design and Test Workshop (IDT)","start":{"date-parts":[[2011,12,11]]},"location":"Beirut, Lebanon","end":{"date-parts":[[2011,12,14]]}},"container-title":["2011 IEEE 6th International Design and Test Workshop (IDT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6111737\/6123091\/06123092.pdf?arnumber=6123092","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T16:06:33Z","timestamp":1490112393000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6123092\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,12]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/idt.2011.6123092","relation":{},"subject":[],"published":{"date-parts":[[2011,12]]}}}